Evaluation of metrology technologies for free form surfaces

K. Arámbula, H.R. Siller, Leonardo De Chiffre, C.A. Rodríguez, Angela Cantatore

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

This research work describes a novel approach for comparing different technologies for free form surface metrology: computerized tomography (CT), photogrammetry and coordinate measuring machines (CMM). The comparison has the aim of providing relevant information for the selection of metrology equipment when measuring free form components. Results demonstrate that there is the imperative need to assess the uncertainty and reproducibility of CT and photogrammetry measurements by applying some calibration procedures taking into account some recommendations for work piece alignment. This article also deals with costs issues, required standards, and necessary additional information when selecting
inspection equipment.
Original languageEnglish
JournalInternational Journal of Metrology and Quality Engineering
Volume3
Issue number1
Pages (from-to)55
ISSN2107-6839
Publication statusPublished - 2012

Keywords

  • Freeform
  • Metrology
  • Computed tomography
  • CMM
  • Photogrammetry

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