Evaluation of metrology technologies for free form surfaces

K. Arámbula, H.R. Siller, Leonardo De Chiffre, C.A. Rodríguez, Angela Cantatore

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    This research work describes a novel approach for comparing different technologies for free form surface metrology: computerized tomography (CT), photogrammetry and coordinate measuring machines (CMM). The comparison has the aim of providing relevant information for the selection of metrology equipment when measuring free form components. Results demonstrate that there is the imperative need to assess the uncertainty and reproducibility of CT and photogrammetry measurements by applying some calibration procedures taking into account some recommendations for work piece alignment. This article also deals with costs issues, required standards, and necessary additional information when selecting
    inspection equipment.
    Original languageEnglish
    JournalInternational Journal of Metrology and Quality Engineering
    Volume3
    Issue number1
    Pages (from-to)55
    ISSN2107-6839
    Publication statusPublished - 2012

    Keywords

    • Freeform
    • Metrology
    • Computed tomography
    • CMM
    • Photogrammetry

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