Abstract
This paper
pr
esents a power density/efficiency
evaluation in single phase power factor correction (PFC)
applications operating in continuous conduction mode (CCM).
The comparison is based on semiconductor dynamic
characterization and a mathematical model for prediction of the
conducted electromagnetic interference (EMI). The dynamic
characterization is based on a low inductive double pulse tester
(DPT). The measured switching energy is used in order to
evaluate the devices performance in a conventional PFC. This
data is used together with the mathematical model for prediction
of the conducted electromagnetic interference. The method
allows comparing different devices and evaluating the
performance as a function of the PFC power density and
efficiency.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of IEEE International Power Electronics and Application Conference and Exposition |
| Publisher | IEEE |
| Publication date | 2014 |
| Pages | 710-715 |
| ISBN (Print) | 978-1-4799-6768-1 |
| Publication status | Published - 2014 |
| Event | 2014 IEEE International Power Electronics and Application Conference and Exposition - Holiday Inn Shanghai Pudong Kangqiao, Shanghai, China Duration: 5 Nov 2014 → 8 Nov 2014 |
Conference
| Conference | 2014 IEEE International Power Electronics and Application Conference and Exposition |
|---|---|
| Location | Holiday Inn Shanghai Pudong Kangqiao |
| Country/Territory | China |
| City | Shanghai |
| Period | 05/11/2014 → 08/11/2014 |
Keywords
- Power factor correction
- Continuous conduction mode
- EMI prediction
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