Evaluating TEM Sample Thickness for Enhanced Temperature Precision in Plasmon Energy Expansion Thermometry (PEET)

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	31
Issue number	7
Pages (from-to)	1355–1356
ISSN	1431-9276
DOIs	https://doi.org/10.1093/mam/ozaf048.701
Publication status	Published - 2025

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@article{9df8355ffa464943bd92a1e391967dee,

title = "Evaluating TEM Sample Thickness for Enhanced Temperature Precision in Plasmon Energy Expansion Thermometry (PEET)",

author = "Yi-Chieh Yang and Luca Serafini and Nicolas Gauquelin and Johan Verbeeck and Jinschek, \{Joerg R.\}",

year = "2025",

doi = "10.1093/mam/ozaf048.701",

language = "English",

volume = "31",

pages = "1355–1356",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "7",

}

TY - ABST

T1 - Evaluating TEM Sample Thickness for Enhanced Temperature Precision in Plasmon Energy Expansion Thermometry (PEET)

AU - Yang, Yi-Chieh

AU - Serafini, Luca

AU - Gauquelin, Nicolas

AU - Verbeeck, Johan

AU - Jinschek, Joerg R.

PY - 2025

Y1 - 2025

U2 - 10.1093/mam/ozaf048.701

DO - 10.1093/mam/ozaf048.701

M3 - Conference abstract in journal

SN - 1431-9276

VL - 31

SP - 1355

EP - 1356

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 7

ER -