Euclid: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS

J. Le Graet; A. Secroun; M. Tourneur-Silvain; W. Gillard; N. Fourmanoit; S. Escoffier; E. Kajfasz; S. Kermiche; B. Kubik; J. Zoubian; S. Andreon; M. Baldi; S. Bardelli; P. Battaglia; D. Bonino; E. Branchini; M. Brescia; J. Brinchmann; A. Caillat; S. Camera; V. Capobianco; C. Carbone; J. Carretero; S. Casas; M. Castellano; G. Castignani; S. Cavuoti; A. Cimatti; C. Colodro-Conde; G. Congedo; C. J. Conselice; L. Conversi; Y. Copin; F. Courbin; H. M. Courtois; A. Da Silva; J. Dinis; M. Douspis; F. Dubath; C. A.J. Duncan; X. Dupac; S. Dusini; A. Ealet; M. Farina; S. Farrens; F. Faustini; S. Ferriol; M. Frailis; E. Franceschi; S. Galeotta; B. Gillis; C. Giocoli; F. Grupp; S. V.H. Haugan; W. Holmes; F. Hormuth; A. Hornstrup; P. Hudelot; K. Jahnke; M. Jhabvala; A. Kiessling; M. Kilbinger; R. Kohley; H. Kurki-Suonio; P. B. Lilje; V. Lindholm; I. Lloro; G. Mainetti; D. Maino; E. Maiorano; O. Mansutti; O. Marggraf; K. Markovic; N. Martinet; F. Marulli; R. Massey; E. Medinaceli; S. Mei; M. Meneghetti; G. Meylan; M. Moresco; L. Moscardini; S. M. Niemi; J. W. Nightingale; C. Padilla; S. Paltani; F. Pasian; K. Pedersen; V. Pettorino; S. Pires; G. Polenta; M. Poncet; L. A. Popa; F. Raison; A. Renzi; J. Rhodes; G. Riccio; E. Romelli; M. Roncarelli; E. Rossetti; R. Saglia; D. Sapone; B. Sartoris; J. A. Schewtschenko; M. Schirmer; G. Seidel; M. Seiffert; C. Sirignano; G. Sirri; L. Stanco; J. Steinwagner; P. Tallada-Crespí; D. Tavagnacco; A. N. Taylor; H. I. Teplitz; I. Tereno; R. Toledo-Moreo; F. Torradeflot; I. Tutusaus; L. Valenziano; T. Vassallo; A. Veropalumbo; Y. Wang; J. Weller

doi:10.1051/0004-6361/202556173

Euclid: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS

J. Le Graet^*
, A. Secroun
, M. Tourneur-Silvain
, W. Gillard
, N. Fourmanoit
, S. Escoffier
, E. Kajfasz
, S. Kermiche
, B. Kubik
, J. Zoubian
, S. Andreon
, M. Baldi
, S. Bardelli
, P. Battaglia
, D. Bonino
, E. Branchini
, M. Brescia
, J. Brinchmann
, A. Caillat
, S. Camera

V. Capobianco, C. Carbone, J. Carretero, S. Casas, M. Castellano, G. Castignani, S. Cavuoti, A. Cimatti, C. Colodro-Conde, G. Congedo, C. J. Conselice, L. Conversi, Y. Copin, F. Courbin, H. M. Courtois, A. Da Silva, J. Dinis, M. Douspis, F. Dubath, C. A.J. Duncan, X. Dupac, S. Dusini, A. Ealet, M. Farina, S. Farrens, F. Faustini, S. Ferriol, M. Frailis, E. Franceschi, S. Galeotta, B. Gillis, C. Giocoli, F. Grupp, S. V.H. Haugan, W. Holmes, F. Hormuth, A. Hornstrup, P. Hudelot, K. Jahnke, M. Jhabvala, A. Kiessling, M. Kilbinger, R. Kohley, H. Kurki-Suonio, P. B. Lilje, V. Lindholm, I. Lloro, G. Mainetti, D. Maino, E. Maiorano, O. Mansutti, O. Marggraf, K. Markovic, N. Martinet, F. Marulli, R. Massey, E. Medinaceli, S. Mei, M. Meneghetti, G. Meylan, M. Moresco, L. Moscardini, S. M. Niemi, J. W. Nightingale, C. Padilla, S. Paltani, F. Pasian, K. Pedersen, V. Pettorino, S. Pires, G. Polenta, M. Poncet, L. A. Popa, F. Raison, A. Renzi, J. Rhodes, G. Riccio, E. Romelli, M. Roncarelli, E. Rossetti, R. Saglia, D. Sapone, B. Sartoris, J. A. Schewtschenko, M. Schirmer, G. Seidel, M. Seiffert, C. Sirignano, G. Sirri, L. Stanco, J. Steinwagner, P. Tallada-Crespí, D. Tavagnacco, A. N. Taylor, H. I. Teplitz, I. Tereno, R. Toledo-Moreo, F. Torradeflot, I. Tutusaus, L. Valenziano, T. Vassallo, A. Veropalumbo, Y. Wang, J. Weller

^*Corresponding author for this work

CNRS
Universite Claude Bernard Lyon 1
Osservatorio Astronomico di Brera
University of Bologna
Istituto di Astrofisica Spaziale e Fisica Cosmica di Bologna
National Institute for Astrophysics
National Institute for Nuclear Physics
University of Naples Federico II
University of Porto
University of Turin
CIEMAT
RWTH Aachen University
Osservatorio Astronomico Roma
Instituto de Astrofísica de Canarias
University of Edinburgh
University of Manchester
European Space Astronomy Centre
Swiss Federal Institute of Technology Lausanne
Institut national de physique nucléaire et de physique des particules
University of Lisbon
Université Paris-Sud
University of Geneva
Université Paris-Saclay
Osservatorio Astronomico di Trieste
Ludwig Maximilian University of Munich
University of Oslo
California Institute of Technology
Felix Hormuth Engineering
Institut d’Astrophysique de Paris
Max Planck Institute for Astronomy
NASA Goddard Space Flight Center
University of Helsinki
Netherlands Institute for Radio Astronomy
University of Milan
University of Bonn
Durham University
Université Paris 7
ESTEC
Newcastle University
Institute for High Energy Physics
University of Copenhagen
Italian Space Agency
Centre national d'études spatiales
Institute of Space Science
Max Planck Institute for Extraterrestrial Physics
University of Padua
Osservatorio Astronomico di Capodimonte
Universidad de Chile
Technical University of Cartagena
Université Paul Sabatier Toulouse III
University of Genoa

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

We introduce a fast method to measure the conversion gain in complementary metal-oxide-semiconductor active pixel sensors, which accounts for nonlinearity and interpixel capacitance (IPC). The standard “mean-variance” method is biased because it assumes that pixel values depend linearly on the signal, and existing methods to correct for nonlinearity still introduce significant biases. While current IPC correction methods are prohibitively slow for a per-pixel application, our new method uses separate measurements of the IPC kernel to calculate the gain almost instantaneously. Using test data from a flight detector of the ESA Euclid mission, the IPC correction recovers the results of slower methods with 0.1% accuracy. The nonlinearity correction ensures that the estimated gain is independent of signal, correcting a bias of more than 2.5%.

Original language	English
Article number	A138
Journal	Astronomy and Astrophysics
Volume	705
Number of pages	12
ISSN	0004-6361
DOIs	https://doi.org/10.1051/0004-6361/202556173
Publication status	Published - 2026

Keywords

Instrumentation: detectors
Methods: data analysis
Methods: numerical
Methods: statistical

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Le Graet, J., Secroun, A., Tourneur-Silvain, M., Gillard, W., Fourmanoit, N., Escoffier, S., Kajfasz, E., Kermiche, S., Kubik, B., Zoubian, J., Andreon, S., Baldi, M., Bardelli, S., Battaglia, P., Bonino, D., Branchini, E., Brescia, M., Brinchmann, J., Caillat, A., ... Weller, J. (2026). Euclid: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS. Astronomy and Astrophysics, 705, Article A138. https://doi.org/10.1051/0004-6361/202556173

@article{735f420790144563885e4ae3d42499d7,

title = "Euclid: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS",

abstract = "We introduce a fast method to measure the conversion gain in complementary metal-oxide-semiconductor active pixel sensors, which accounts for nonlinearity and interpixel capacitance (IPC). The standard “mean-variance” method is biased because it assumes that pixel values depend linearly on the signal, and existing methods to correct for nonlinearity still introduce significant biases. While current IPC correction methods are prohibitively slow for a per-pixel application, our new method uses separate measurements of the IPC kernel to calculate the gain almost instantaneously. Using test data from a flight detector of the ESA Euclid mission, the IPC correction recovers the results of slower methods with 0.1\% accuracy. The nonlinearity correction ensures that the estimated gain is independent of signal, correcting a bias of more than 2.5\%. ",

keywords = "Instrumentation: detectors, Methods: data analysis, Methods: numerical, Methods: statistical",

author = "\{Le Graet\}, J. and A. Secroun and M. Tourneur-Silvain and W. Gillard and N. Fourmanoit and S. Escoffier and E. Kajfasz and S. Kermiche and B. Kubik and J. Zoubian and S. Andreon and M. Baldi and S. Bardelli and P. Battaglia and D. Bonino and E. Branchini and M. Brescia and J. Brinchmann and A. Caillat and S. Camera and V. Capobianco and C. Carbone and J. Carretero and S. Casas and M. Castellano and G. Castignani and S. Cavuoti and A. Cimatti and C. Colodro-Conde and G. Congedo and Conselice, \{C. J.\} and L. Conversi and Y. Copin and F. Courbin and Courtois, \{H. M.\} and \{Da Silva\}, A. and J. Dinis and M. Douspis and F. Dubath and Duncan, \{C. A.J.\} and X. Dupac and S. Dusini and A. Ealet and M. Farina and S. Farrens and F. Faustini and S. Ferriol and M. Frailis and E. Franceschi and S. Galeotta and B. Gillis and C. Giocoli and F. Grupp and Haugan, \{S. V.H.\} and W. Holmes and F. Hormuth and A. Hornstrup and P. Hudelot and K. Jahnke and M. Jhabvala and A. Kiessling and M. Kilbinger and R. Kohley and H. Kurki-Suonio and Lilje, \{P. B.\} and V. Lindholm and I. Lloro and G. Mainetti and D. Maino and E. Maiorano and O. Mansutti and O. Marggraf and K. Markovic and N. Martinet and F. Marulli and R. Massey and E. Medinaceli and S. Mei and M. Meneghetti and G. Meylan and M. Moresco and L. Moscardini and Niemi, \{S. M.\} and Nightingale, \{J. W.\} and C. Padilla and S. Paltani and F. Pasian and K. Pedersen and V. Pettorino and S. Pires and G. Polenta and M. Poncet and Popa, \{L. A.\} and F. Raison and A. Renzi and J. Rhodes and G. Riccio and E. Romelli and M. Roncarelli and E. Rossetti and R. Saglia and D. Sapone and B. Sartoris and Schewtschenko, \{J. A.\} and M. Schirmer and G. Seidel and M. Seiffert and C. Sirignano and G. Sirri and L. Stanco and J. Steinwagner and P. Tallada-Cresp{\'i} and D. Tavagnacco and Taylor, \{A. N.\} and Teplitz, \{H. I.\} and I. Tereno and R. Toledo-Moreo and F. Torradeflot and I. Tutusaus and L. Valenziano and T. Vassallo and A. Veropalumbo and Y. Wang and J. Weller",

note = "Publisher Copyright: {\textcopyright} 2026 The Authors.",

year = "2026",

doi = "10.1051/0004-6361/202556173",

language = "English",

volume = "705",

journal = "Astronomy and Astrophysics",

issn = "0004-6361",

publisher = "EDP Sciences",

}

Le Graet, J, Secroun, A, Tourneur-Silvain, M, Gillard, W, Fourmanoit, N, Escoffier, S, Kajfasz, E, Kermiche, S, Kubik, B, Zoubian, J, Andreon, S, Baldi, M, Bardelli, S, Battaglia, P, Bonino, D, Branchini, E, Brescia, M, Brinchmann, J, Caillat, A, Camera, S, Capobianco, V, Carbone, C, Carretero, J, Casas, S, Castellano, M, Castignani, G, Cavuoti, S, Cimatti, A, Colodro-Conde, C, Congedo, G, Conselice, CJ, Conversi, L, Copin, Y, Courbin, F, Courtois, HM, Da Silva, A, Dinis, J, Douspis, M, Dubath, F, Duncan, CAJ, Dupac, X, Dusini, S, Ealet, A, Farina, M, Farrens, S, Faustini, F, Ferriol, S, Frailis, M, Franceschi, E, Galeotta, S, Gillis, B, Giocoli, C, Grupp, F, Haugan, SVH, Holmes, W, Hormuth, F, Hornstrup, A, Hudelot, P, Jahnke, K, Jhabvala, M, Kiessling, A, Kilbinger, M, Kohley, R, Kurki-Suonio, H, Lilje, PB, Lindholm, V, Lloro, I, Mainetti, G, Maino, D, Maiorano, E, Mansutti, O, Marggraf, O, Markovic, K, Martinet, N, Marulli, F, Massey, R, Medinaceli, E, Mei, S, Meneghetti, M, Meylan, G, Moresco, M, Moscardini, L, Niemi, SM, Nightingale, JW, Padilla, C, Paltani, S, Pasian, F, Pedersen, K, Pettorino, V, Pires, S, Polenta, G, Poncet, M, Popa, LA, Raison, F, Renzi, A, Rhodes, J, Riccio, G, Romelli, E, Roncarelli, M, Rossetti, E, Saglia, R, Sapone, D, Sartoris, B, Schewtschenko, JA, Schirmer, M, Seidel, G, Seiffert, M, Sirignano, C, Sirri, G, Stanco, L, Steinwagner, J, Tallada-Crespí, P, Tavagnacco, D, Taylor, AN, Teplitz, HI, Tereno, I, Toledo-Moreo, R, Torradeflot, F, Tutusaus, I, Valenziano, L, Vassallo, T, Veropalumbo, A, Wang, Y & Weller, J 2026, 'Euclid: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS', Astronomy and Astrophysics, vol. 705, A138. https://doi.org/10.1051/0004-6361/202556173

TY - JOUR

T1 - Euclid: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS

AU - Le Graet, J.

AU - Secroun, A.

AU - Tourneur-Silvain, M.

AU - Gillard, W.

AU - Fourmanoit, N.

AU - Escoffier, S.

AU - Kajfasz, E.

AU - Kermiche, S.

AU - Kubik, B.

AU - Zoubian, J.

AU - Andreon, S.

AU - Baldi, M.

AU - Bardelli, S.

AU - Battaglia, P.

AU - Bonino, D.

AU - Branchini, E.

AU - Brescia, M.

AU - Brinchmann, J.

AU - Caillat, A.

AU - Camera, S.

AU - Capobianco, V.

AU - Carbone, C.

AU - Carretero, J.

AU - Casas, S.

AU - Castellano, M.

AU - Castignani, G.

AU - Cavuoti, S.

AU - Cimatti, A.

AU - Colodro-Conde, C.

AU - Congedo, G.

AU - Conselice, C. J.

AU - Conversi, L.

AU - Copin, Y.

AU - Courbin, F.

AU - Courtois, H. M.

AU - Da Silva, A.

AU - Dinis, J.

AU - Douspis, M.

AU - Dubath, F.

AU - Duncan, C. A.J.

AU - Dupac, X.

AU - Dusini, S.

AU - Ealet, A.

AU - Farina, M.

AU - Farrens, S.

AU - Faustini, F.

AU - Ferriol, S.

AU - Frailis, M.

AU - Franceschi, E.

AU - Galeotta, S.

AU - Gillis, B.

AU - Giocoli, C.

AU - Grupp, F.

AU - Haugan, S. V.H.

AU - Holmes, W.

AU - Hormuth, F.

AU - Hornstrup, A.

AU - Hudelot, P.

AU - Jahnke, K.

AU - Jhabvala, M.

AU - Kiessling, A.

AU - Kilbinger, M.

AU - Kohley, R.

AU - Kurki-Suonio, H.

AU - Lilje, P. B.

AU - Lindholm, V.

AU - Lloro, I.

AU - Mainetti, G.

AU - Maino, D.

AU - Maiorano, E.

AU - Mansutti, O.

AU - Marggraf, O.

AU - Markovic, K.

AU - Martinet, N.

AU - Marulli, F.

AU - Massey, R.

AU - Medinaceli, E.

AU - Mei, S.

AU - Meneghetti, M.

AU - Meylan, G.

AU - Moresco, M.

AU - Moscardini, L.

AU - Niemi, S. M.

AU - Nightingale, J. W.

AU - Padilla, C.

AU - Paltani, S.

AU - Pasian, F.

AU - Pedersen, K.

AU - Pettorino, V.

AU - Pires, S.

AU - Polenta, G.

AU - Poncet, M.

AU - Popa, L. A.

AU - Raison, F.

AU - Renzi, A.

AU - Rhodes, J.

AU - Riccio, G.

AU - Romelli, E.

AU - Roncarelli, M.

AU - Rossetti, E.

AU - Saglia, R.

AU - Sapone, D.

AU - Sartoris, B.

AU - Schewtschenko, J. A.

AU - Schirmer, M.

AU - Seidel, G.

AU - Seiffert, M.

AU - Sirignano, C.

AU - Sirri, G.

AU - Stanco, L.

AU - Steinwagner, J.

AU - Tallada-Crespí, P.

AU - Tavagnacco, D.

AU - Taylor, A. N.

AU - Teplitz, H. I.

AU - Tereno, I.

AU - Toledo-Moreo, R.

AU - Torradeflot, F.

AU - Tutusaus, I.

AU - Valenziano, L.

AU - Vassallo, T.

AU - Veropalumbo, A.

AU - Wang, Y.

AU - Weller, J.

PY - 2026

Y1 - 2026

N2 - We introduce a fast method to measure the conversion gain in complementary metal-oxide-semiconductor active pixel sensors, which accounts for nonlinearity and interpixel capacitance (IPC). The standard “mean-variance” method is biased because it assumes that pixel values depend linearly on the signal, and existing methods to correct for nonlinearity still introduce significant biases. While current IPC correction methods are prohibitively slow for a per-pixel application, our new method uses separate measurements of the IPC kernel to calculate the gain almost instantaneously. Using test data from a flight detector of the ESA Euclid mission, the IPC correction recovers the results of slower methods with 0.1% accuracy. The nonlinearity correction ensures that the estimated gain is independent of signal, correcting a bias of more than 2.5%.

AB - We introduce a fast method to measure the conversion gain in complementary metal-oxide-semiconductor active pixel sensors, which accounts for nonlinearity and interpixel capacitance (IPC). The standard “mean-variance” method is biased because it assumes that pixel values depend linearly on the signal, and existing methods to correct for nonlinearity still introduce significant biases. While current IPC correction methods are prohibitively slow for a per-pixel application, our new method uses separate measurements of the IPC kernel to calculate the gain almost instantaneously. Using test data from a flight detector of the ESA Euclid mission, the IPC correction recovers the results of slower methods with 0.1% accuracy. The nonlinearity correction ensures that the estimated gain is independent of signal, correcting a bias of more than 2.5%.

KW - Instrumentation: detectors

KW - Methods: data analysis

KW - Methods: numerical

KW - Methods: statistical

U2 - 10.1051/0004-6361/202556173

DO - 10.1051/0004-6361/202556173

M3 - Journal article

AN - SCOPUS:105027944063

SN - 0004-6361

VL - 705

JO - Astronomy and Astrophysics

JF - Astronomy and Astrophysics

M1 - A138

ER -

Euclid: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS

Abstract

Keywords

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