Error sources in Atomic Force Microscopy for dimensional measurements

Lorenzo Carli, Francesco Marinello, Simone Carmignato, Alessandro Voltan, Enrico Savio, Leonardo De Chiffre

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 8. AITeM Conference
    Volume1
    Publication date2007
    Pages95-96
    ISBN (Print)88-7957-264-4
    Publication statusPublished - 2007
    Event8th Associazione Italiana Tecnologia Meccanica conference - Montecatini, Italy
    Duration: 10 Sept 200712 Sept 2007
    Conference number: 8

    Conference

    Conference8th Associazione Italiana Tecnologia Meccanica conference
    Number8
    Country/TerritoryItaly
    CityMontecatini
    Period10/09/200712/09/2007

    Keywords

    • error sources
    • dimensional measurements
    • Atomic Force Microscope

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