Abstract
The increasing use of environmental transmission electron microscopy (ETEM) in materials science
provides exciting new possibilities for investigating chemical reactions and understanding both the interaction
of fast electrons with gas molecules and the effect of the presence of gas on high‐resolution imaging. A
gaseous atmosphere in the pole‐piece gap of the objective lens of the microscope alters both the incoming
electron wave prior to interaction with the sample and the outgoing wave below the sample. Whereas
conventional TEM samples are usually thin (below 10‐20 nm), the gas in the environmental cell fills the entire
gap between the pole pieces and is thus not spatially localized. By using an FEI Titan ETEM equipped with a
monochromator and an aberration corrector on the objective lens, we have investigated the effects on
imaging and spectroscopy caused by the presence of the gas.
State‐of‐the‐art aberration corrected TEMs provide electron micrographs with high spatial resolution. The
apparent interpretability of such images encourages microscopists to analyze data more quantitatively. Such
an analysis requires a detailed knowledge of the entire path and propagation of the electrons along the
microscope column. The effects of gas on the electron wave in the objective lens are not well understood and
needs further attention. Imaging samples with a simple geometry, such as gold particles on a flat graphene
substrate and analyzing the variations in contrast, provides a means for understanding the issues involved
with imaging in the presence of a gas. Furthermore, electron energy‐loss spectroscopy can tell us about the
local chemical environment in the vicinity of the sample.
Using a differentially pumped FEI Titan 80‐300 Titan ETEM, high‐resolution TEM micrographs and electron
energy‐loss spectra were acquired from Au/graphene samples in vacuum and in a hydrogen atmosphere at
pressures up to 700Pa. The gases were introduced into the environmental cell using digitally controlled mass
flow controllers, providing accurate and stable control of the pressure in the cell. The loss of beam intensity
when traversing the pole piece gap was measured by recording the signal outside the sample region on the
pre‐GIF CCD camera (see Figure 1 left). The effects on high resolution imaging were investigated by imaging
gold nanoparticles below 5nm in diameter (see Figure 1 middle and right).
We will present results from imaging in various elemental as well as di‐molecular gases and their effect on
imaging and spectroscopy in the environmental transmission electron microscope.
Original language | English |
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Publication date | 2011 |
Publication status | Published - 2011 |
Event | Microscopy & Microanalysis : Pre-Meeting Specialist Workshop on Opportunities, Artifacts and Interpretation of Aberration-Corrected Electron Microscopy Data - Nashville, United States Duration: 7 Aug 2011 → 7 Aug 2011 |
Conference
Conference | Microscopy & Microanalysis : Pre-Meeting Specialist Workshop on Opportunities, Artifacts and Interpretation of Aberration-Corrected Electron Microscopy Data |
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Country/Territory | United States |
City | Nashville |
Period | 07/08/2011 → 07/08/2011 |