Enhancement of Electroluminescence images for fault detection in photovoltaic panels

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    Abstract

    Good quality images are necessary for electroluminescence (EL) image analysis and failure quantification in solar panels. In this work, a method for determining image quality in terms of more accurate failure detection in PV panels through EL imaging is proposed. The goal of the paper is to highlight the different methods for image quality improvement and to determine if the enhanced image provides more useful diagnostic information for accurate micro cracks and fracture detection. From the work carried out in this paper, it is to be noted that averaging technique helps in improving the SNR value. Additionally, subtracting the background from the obtained averaged EL image proves to be an enhancing method for cell fracture identification and more number of edges are also detected which can be useful for micro crack quantification.
    Original languageEnglish
    Title of host publicationProceedings of 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion
    PublisherIEEE
    Publication date2018
    Pages0447-0452
    ISBN (Print)9781538685297
    DOIs
    Publication statusPublished - 2018
    Event7th World Conference on Photovoltaic Energy Conversion - Hilton Waikoloa Village Resort, Waikoloa, United States
    Duration: 10 Jun 201815 Jun 2018
    Conference number: WCPEC-7

    Conference

    Conference7th World Conference on Photovoltaic Energy Conversion
    NumberWCPEC-7
    LocationHilton Waikoloa Village Resort
    Country/TerritoryUnited States
    CityWaikoloa
    Period10/06/201815/06/2018

    Keywords

    • Signal to noise ratio
    • Image quality
    • Image enhancement
    • Benchmark testing
    • Image edge detection
    • Cameras
    • Sensitivity

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