Enhancement of Electroluminescence (EL) image measurements for failure quantification methods

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Abstract

Good quality images are necessary for electroluminescence (EL) image analysis and failure quantification in solar panels. In this work, a method for determining image quality in terms of more accurate failure detection in PV panels through EL imaging is proposed. The goal of the paper is to highlight the different methods for image quality improvement and to determine if the enhanced image provides more useful diagnostic information for accurate micro cracks and fracture detection. From the work carried out in this paper, it is to be noted that averaging technique helps in improving the SNR value. Additionally, subtracting the background from the obtained averaged EL image proves to be an enhancing method for cell fracture identification and more number of edges are also detected which can be useful for micro
crack quantification.
Original languageEnglish
Title of host publicationProceedings of 7th World Conference on Photovoltaic Energy Conversion
Number of pages6
PublisherIEEE
Publication date2018
Publication statusPublished - 2018
Event7th World Conference on Photovoltaic Energy Conversion - Hilton Waikoloa Village Resort, Waikoloa, United States
Duration: 10 Jun 201815 Jun 2018
Conference number: WCPEC-7

Conference

Conference7th World Conference on Photovoltaic Energy Conversion
NumberWCPEC-7
LocationHilton Waikoloa Village Resort
CountryUnited States
CityWaikoloa
Period10/06/201815/06/2018

Cite this

Parikh, H. R., Spataru, S., Sera, D., Mantel, C., Forchhammer, S., Benatto, G. A. D. R., ... Poulsen, P. B. (2018). Enhancement of Electroluminescence (EL) image measurements for failure quantification methods. In Proceedings of 7th World Conference on Photovoltaic Energy Conversion IEEE.
@inproceedings{f0173b03283f435bbab5a2f2cac36d87,
title = "Enhancement of Electroluminescence (EL) image measurements for failure quantification methods",
abstract = "Good quality images are necessary for electroluminescence (EL) image analysis and failure quantification in solar panels. In this work, a method for determining image quality in terms of more accurate failure detection in PV panels through EL imaging is proposed. The goal of the paper is to highlight the different methods for image quality improvement and to determine if the enhanced image provides more useful diagnostic information for accurate micro cracks and fracture detection. From the work carried out in this paper, it is to be noted that averaging technique helps in improving the SNR value. Additionally, subtracting the background from the obtained averaged EL image proves to be an enhancing method for cell fracture identification and more number of edges are also detected which can be useful for microcrack quantification.",
author = "Parikh, {Harsh R.} and Sergiu Spataru and Dezso Sera and Claire Mantel and S{\o}ren Forchhammer and Benatto, {Gisele Alves dos Reis} and Nicholas Riedel and Poulsen, {Peter Behrensdorff}",
year = "2018",
language = "English",
booktitle = "Proceedings of 7th World Conference on Photovoltaic Energy Conversion",
publisher = "IEEE",
address = "United States",

}

Parikh, HR, Spataru, S, Sera, D, Mantel, C, Forchhammer, S, Benatto, GADR, Riedel, N & Poulsen, PB 2018, Enhancement of Electroluminescence (EL) image measurements for failure quantification methods. in Proceedings of 7th World Conference on Photovoltaic Energy Conversion. IEEE, 7th World Conference on Photovoltaic Energy Conversion , Waikoloa, United States, 10/06/2018.

Enhancement of Electroluminescence (EL) image measurements for failure quantification methods. / Parikh, Harsh R.; Spataru, Sergiu; Sera, Dezso; Mantel, Claire; Forchhammer, Søren; Benatto, Gisele Alves dos Reis; Riedel, Nicholas; Poulsen, Peter Behrensdorff.

Proceedings of 7th World Conference on Photovoltaic Energy Conversion. IEEE, 2018.

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

TY - GEN

T1 - Enhancement of Electroluminescence (EL) image measurements for failure quantification methods

AU - Parikh, Harsh R.

AU - Spataru, Sergiu

AU - Sera, Dezso

AU - Mantel, Claire

AU - Forchhammer, Søren

AU - Benatto, Gisele Alves dos Reis

AU - Riedel, Nicholas

AU - Poulsen, Peter Behrensdorff

PY - 2018

Y1 - 2018

N2 - Good quality images are necessary for electroluminescence (EL) image analysis and failure quantification in solar panels. In this work, a method for determining image quality in terms of more accurate failure detection in PV panels through EL imaging is proposed. The goal of the paper is to highlight the different methods for image quality improvement and to determine if the enhanced image provides more useful diagnostic information for accurate micro cracks and fracture detection. From the work carried out in this paper, it is to be noted that averaging technique helps in improving the SNR value. Additionally, subtracting the background from the obtained averaged EL image proves to be an enhancing method for cell fracture identification and more number of edges are also detected which can be useful for microcrack quantification.

AB - Good quality images are necessary for electroluminescence (EL) image analysis and failure quantification in solar panels. In this work, a method for determining image quality in terms of more accurate failure detection in PV panels through EL imaging is proposed. The goal of the paper is to highlight the different methods for image quality improvement and to determine if the enhanced image provides more useful diagnostic information for accurate micro cracks and fracture detection. From the work carried out in this paper, it is to be noted that averaging technique helps in improving the SNR value. Additionally, subtracting the background from the obtained averaged EL image proves to be an enhancing method for cell fracture identification and more number of edges are also detected which can be useful for microcrack quantification.

M3 - Article in proceedings

BT - Proceedings of 7th World Conference on Photovoltaic Energy Conversion

PB - IEEE

ER -

Parikh HR, Spataru S, Sera D, Mantel C, Forchhammer S, Benatto GADR et al. Enhancement of Electroluminescence (EL) image measurements for failure quantification methods. In Proceedings of 7th World Conference on Photovoltaic Energy Conversion. IEEE. 2018