Enhanced model for scanning tunnelling microscope tip geometry measured with field ion microscope

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume	22
Pages (from-to)	636
ISSN	1071-1023
Publication status	Published - 2004

OpenUrl availability

@article{8240de439b4c458d9a517c09216d2548,

title = "Enhanced model for scanning tunnelling microscope tip geometry measured with field ion microscope",

author = "P.V.M. Rao and Jensen, \{Carsten P.\} and R.M. Silver",

year = "2004",

language = "English",

volume = "22",

pages = "636",

journal = "Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures",

issn = "1071-1023",

}

TY - JOUR

T1 - Enhanced model for scanning tunnelling microscope tip geometry measured with field ion microscope

AU - Rao, P.V.M.

AU - Jensen, Carsten P.

AU - Silver, R.M.

PY - 2004

Y1 - 2004

M3 - Journal article

SN - 1071-1023

VL - 22

SP - 636

JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

ER -