Enhanced model for scanning tunnelling microscope tip geometry measured with field ion microscope

P.V.M. Rao, Carsten P. Jensen, R.M. Silver

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	Journal of Vacuum Science & Technology B
Volume	22
Pages (from-to)	636
ISSN	1071-1023
Publication status	Published - 2004

OpenUrl availability

@article{8240de439b4c458d9a517c09216d2548,

title = "Enhanced model for scanning tunnelling microscope tip geometry measured with field ion microscope",

author = "P.V.M. Rao and Jensen, {Carsten P.} and R.M. Silver",

year = "2004",

language = "English",

volume = "22",

pages = "636",

journal = "Journal of Vacuum Science & Technology B",

issn = "1071-1023",

publisher = "American Institute of Physics",

}