Enhanced model for scanning tunnelling microscope tip geometry measured with field ion microscope

P.V.M. Rao, Carsten P. Jensen, R.M. Silver

Research output: Contribution to journalJournal articleResearchpeer-review

Original languageEnglish
JournalJournal of Vacuum Science & Technology B
Volume22
Pages (from-to)636
ISSN1071-1023
Publication statusPublished - 2004

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