Engineering Electrochemical Setups for Electron Microscopy of Liquid Processes

Eric Jensen, Andrew Burrows, Kristian Mølhave

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

Original language	English
Book series	Advances in Imaging and Electron Physics
Volume	179
Pages (from-to)	196
ISSN	1076-5670
DOIs	https://doi.org/10.1016/B978-0-12-407700-3.00002-8
Publication status	Published - 2012
Event	Conference on In-Situ and Correlative Electron Microscopy (CISCEM) - Saarbrücken, Germany Duration: 6 Nov 2012 → 7 Nov 2012 http://www.inm-gmbh.de/conference-on-in-situ-and-correlative-electron-microscopy-ciscem/

Conference	Conference on In-Situ and Correlative Electron Microscopy (CISCEM)
Country/Territory	Germany
City	Saarbrücken
Period	06/11/2012 → 07/11/2012
Internet address	http://www.inm-gmbh.de/conference-on-in-situ-and-correlative-electron-microscopy-ciscem/

Access to Document

@article{0b3516e9d4c94d93831fc88ebc70c575,

title = "Engineering Electrochemical Setups for Electron Microscopy of Liquid Processes",

author = "Eric Jensen and Andrew Burrows and Kristian M{\o}lhave",

year = "2012",

doi = "10.1016/B978-0-12-407700-3.00002-8",

language = "English",

volume = "179",

pages = "196",

journal = "Advances in Imaging and Electron Physics",

issn = "1076-5670",

publisher = "Academic Press",

note = "Conference on In-Situ and Correlative Electron Microscopy (CISCEM) ; Conference date: 06-11-2012 Through 07-11-2012",

url = "http://www.inm-gmbh.de/conference-on-in-situ-and-correlative-electron-microscopy-ciscem/",

}

TY - ABST

T1 - Engineering Electrochemical Setups for Electron Microscopy of Liquid Processes

AU - Jensen, Eric

AU - Burrows, Andrew

AU - Mølhave, Kristian

PY - 2012

Y1 - 2012

U2 - 10.1016/B978-0-12-407700-3.00002-8

DO - 10.1016/B978-0-12-407700-3.00002-8

M3 - Conference abstract in journal

SN - 1076-5670

VL - 179

SP - 196

JO - Advances in Imaging and Electron Physics

JF - Advances in Imaging and Electron Physics

T2 - Conference on In-Situ and Correlative Electron Microscopy (CISCEM)

Y2 - 6 November 2012 through 7 November 2012

ER -