Energy-dispersive X-ray spectroscopy in the low vacuum and environmental scanning electron microscopes

Jørgen Bilde-Sørensen

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date2000
    Publication statusPublished - 2000
    EventSEM 2000: Scanning Electron Microscopy - imaging and microanalysis - Chalmers Technical University, Göteborg, Sweden
    Duration: 17 Oct 200019 Oct 2000

    Course

    CourseSEM 2000: Scanning Electron Microscopy - imaging and microanalysis
    LocationChalmers Technical University
    CountrySweden
    CityGöteborg
    Period17/10/200019/10/2000

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