EM Simulation Accuracy Enhancement for Broadband Modeling of On-Wafer Passive Components

Tom Keinicke Johansen; Chenhui Jiang; Dzenan Hadziabdic; Viktor Krozer

doi:10.1109/EUMC.2007.4405426

EM Simulation Accuracy Enhancement for Broadband Modeling of On-Wafer Passive Components

Tom Keinicke Johansen
, Chenhui Jiang
, Dzenan Hadziabdic
, Viktor Krozer

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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Abstract

This paper describes methods for accuracy enhancement in broadband modeling of on-wafer passive components using electromagnetic (EM) simulation. It is shown that standard excitation schemes for integrated component simulation leads to poor correlation with on-wafer measurements beyond the lower GHz frequency range. We show that this is due to parasitic effects and higher-order modes caused by the excitation schemes. We propose a simple equivalent circuit for the parasitic effects in the well-known ground ring excitation scheme. An extended L-2L calibration method is shown to improve significantly the accuracy of the on-wafer component modeling, when applied to parasitic effect removal associated with the excitation schemes.

Original language	English
Title of host publication	Proceedings of the 37th European Microwave Conference : EuMIC 2007
Publisher	IEEE
Publication date	2007
Pages	1245-1248
ISBN (Print)	978-2-87487-001-9
DOIs	https://doi.org/10.1109/EUMC.2007.4405426
Publication status	Published - 2007
Event	2nd European Microwave Integrated Circuit Conference - Munich, Germany Duration: 8 Oct 2007 → 10 Oct 2007 Conference number: 2 https://ieeexplore.ieee.org/xpl/conhome/4412607/proceeding

Conference

Conference	2nd European Microwave Integrated Circuit Conference
Number	2
Country/Territory	Germany
City	Munich
Period	08/10/2007 → 10/10/2007
Internet address	https://ieeexplore.ieee.org/xpl/conhome/4412607/proceeding

Bibliographical note

Copyright: 2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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10.1109/EUMC.2007.4405426

04405426 Johansen EuMIC 2007Final published version, 147 KB

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title = "EM Simulation Accuracy Enhancement for Broadband Modeling of On-Wafer Passive Components",

abstract = "This paper describes methods for accuracy enhancement in broadband modeling of on-wafer passive components using electromagnetic (EM) simulation. It is shown that standard excitation schemes for integrated component simulation leads to poor correlation with on-wafer measurements beyond the lower GHz frequency range. We show that this is due to parasitic effects and higher-order modes caused by the excitation schemes. We propose a simple equivalent circuit for the parasitic effects in the well-known ground ring excitation scheme. An extended L-2L calibration method is shown to improve significantly the accuracy of the on-wafer component modeling, when applied to parasitic effect removal associated with the excitation schemes.",

author = "Johansen, \{Tom Keinicke\} and Chenhui Jiang and Dzenan Hadziabdic and Viktor Krozer",

note = "Copyright: 2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE; 2nd European Microwave Integrated Circuit Conference, EuMIC 2007 ; Conference date: 08-10-2007 Through 10-10-2007",

year = "2007",

doi = "10.1109/EUMC.2007.4405426",

language = "English",

isbn = "978-2-87487-001-9",

pages = "1245--1248",

booktitle = "Proceedings of the 37th European Microwave Conference",

publisher = "IEEE",

address = "United States",

url = "https://ieeexplore.ieee.org/xpl/conhome/4412607/proceeding",

}

Johansen, TK, Jiang, C, Hadziabdic, D & Krozer, V 2007, EM Simulation Accuracy Enhancement for Broadband Modeling of On-Wafer Passive Components. in Proceedings of the 37th European Microwave Conference: EuMIC 2007. IEEE, pp. 1245-1248, 2nd European Microwave Integrated Circuit Conference, Munich, Bavaria, Germany, 08/10/2007. https://doi.org/10.1109/EUMC.2007.4405426

TY - GEN

T1 - EM Simulation Accuracy Enhancement for Broadband Modeling of On-Wafer Passive Components

AU - Johansen, Tom Keinicke

AU - Jiang, Chenhui

AU - Hadziabdic, Dzenan

AU - Krozer, Viktor

N1 - Conference code: 2

PY - 2007

Y1 - 2007

N2 - This paper describes methods for accuracy enhancement in broadband modeling of on-wafer passive components using electromagnetic (EM) simulation. It is shown that standard excitation schemes for integrated component simulation leads to poor correlation with on-wafer measurements beyond the lower GHz frequency range. We show that this is due to parasitic effects and higher-order modes caused by the excitation schemes. We propose a simple equivalent circuit for the parasitic effects in the well-known ground ring excitation scheme. An extended L-2L calibration method is shown to improve significantly the accuracy of the on-wafer component modeling, when applied to parasitic effect removal associated with the excitation schemes.

AB - This paper describes methods for accuracy enhancement in broadband modeling of on-wafer passive components using electromagnetic (EM) simulation. It is shown that standard excitation schemes for integrated component simulation leads to poor correlation with on-wafer measurements beyond the lower GHz frequency range. We show that this is due to parasitic effects and higher-order modes caused by the excitation schemes. We propose a simple equivalent circuit for the parasitic effects in the well-known ground ring excitation scheme. An extended L-2L calibration method is shown to improve significantly the accuracy of the on-wafer component modeling, when applied to parasitic effect removal associated with the excitation schemes.

U2 - 10.1109/EUMC.2007.4405426

DO - 10.1109/EUMC.2007.4405426

M3 - Article in proceedings

SN - 978-2-87487-001-9

SP - 1245

EP - 1248

BT - Proceedings of the 37th European Microwave Conference

PB - IEEE

T2 - 2nd European Microwave Integrated Circuit Conference

Y2 - 8 October 2007 through 10 October 2007

ER -

EM Simulation Accuracy Enhancement for Broadband Modeling of On-Wafer Passive Components

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