EM Simulation Accuracy Enhancement for Broadband Modeling of On-Wafer Passive Components

Tom Keinicke Johansen, Chenhui Jiang, Dzenan Hadziabdic, Viktor Krozer

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Abstract

This paper describes methods for accuracy enhancement in broadband modeling of on-wafer passive components using electromagnetic (EM) simulation. It is shown that standard excitation schemes for integrated component simulation leads to poor correlation with on-wafer measurements beyond the lower GHz frequency range. We show that this is due to parasitic effects and higher-order modes caused by the excitation schemes. We propose a simple equivalent circuit for the parasitic effects in the well-known ground ring excitation scheme. An extended L-2L calibration method is shown to improve significantly the accuracy of the on-wafer component modeling, when applied to parasitic effect removal associated with the excitation schemes.
Original languageEnglish
Title of host publicationProceedings of the 37th European Microwave Conference : EuMIC 2007
PublisherIEEE
Publication date2007
Pages1245-1248
ISBN (Print)978-2-87487-001-9
DOIs
Publication statusPublished - 2007
EventEuropean Microwave Integrated Circuits - Munich, Germany
Duration: 1 Jan 2007 → …

Conference

ConferenceEuropean Microwave Integrated Circuits
CityMunich, Germany
Period01/01/2007 → …

Bibliographical note

Copyright: 2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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