EM Simulation Accuracy Enhancement for Broadband Modeling of On-Wafer Passive Components

Tom Keinicke Johansen, Chenhui Jiang, Dzenan Hadziabdic, Viktor Krozer

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This paper describes methods for accuracy enhancement in broadband modeling of on-wafer passive components using electromagnetic (EM) simulation. It is shown that standard excitation schemes for integrated component simulation leads to poor correlation with on-wafer measurements beyond the lower GHz frequency range. We show that this is due to parasitic effects and higher-order modes caused by the excitation schemes. We propose a simple equivalent circuit for the parasitic effects in the well-known ground ring excitation scheme. An extended L-2L calibration method is shown to improve significantly the accuracy of the on-wafer component modeling, when applied to parasitic effect removal associated with the excitation schemes.
Original languageEnglish
Title of host publicationProceedings of the 37th European Microwave Conference : EuMIC 2007
Publication date2007
ISBN (Print)978-2-87487-001-9
Publication statusPublished - 2007
EventEuropean Microwave Integrated Circuits - Munich, Germany
Duration: 1 Jan 2007 → …


ConferenceEuropean Microwave Integrated Circuits
CityMunich, Germany
Period01/01/2007 → …

Bibliographical note

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