Electron Shadow edge microscopy of reverse-biased p-n junctions

P. F. Fazzini, Marco Beleggia, G. Pozzi

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the 13th European Microscopy Congress
Number of pages2
Volume2
Publication date2004
Pages385-386
Publication statusPublished - 2004
Externally publishedYes
Event13th European Microscopy Congress - Antwerp, Belgium
Duration: 22 Aug 200427 Aug 2004

Conference

Conference13th European Microscopy Congress
CountryBelgium
CityAntwerp
Period22/08/200427/08/2004

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