Electron optical phase-shifts by Fourier methods: Analytical versus numerical calculations

P. F. Fazzini, G. Pozzi, M. Beleggia

Research output: Contribution to journalJournal articleResearch

Abstract

The theoretical framework for the computation of electromagnetic fields and electron optical phase-shifts in Fourier space has been recently applied to objects with long-range fringing fields, such as reverse-biased p–n junctions and magnetic stripe domains near a specimen edge. In addition to new analytical results, in this work, we present a critical comparison between numerical and analytical computations. The influence of explicit and implicit boundary conditions on the phase shifts and phase-contrast images is also investigated in detail.
Original languageEnglish
JournalULTRAMICROSCOPY
Volume104
Issue number3-4
Pages (from-to)193-205
Number of pages15
ISSN0304-3991
DOIs
Publication statusPublished - 2005
Externally publishedYes

Keywords

  • Electromagnetic fields
  • Electron optical phase-shift
  • Lorentz microscopy
  • Electron holography
  • Image simulation

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