The aim of this paper is to present and discuss the recent results obtained in the investigation of reverse-biased p–n junctions by means of the out-of-focus method. It will be shown how the interpretation of the experimental images is not in agreement with the expectations based on the bulk p–n junction theory. The possible causes of this discrepancy will be discussed: among them a significant reason could be the finite specimen thickness with the associated surface states, which influences the width and shape of the depletion layer in the thinned specimen.
|Number of pages||6|
|Publication status||Published - 2000|
|Event||Workshop on Microstructural and Microanalytical Characterisation of Semiconducting Materials and Devices - Lecce, Italy|
Duration: 4 Nov 1998 → 11 Nov 1998
|Workshop||Workshop on Microstructural and Microanalytical Characterisation of Semiconducting Materials and Devices|
|Period||04/11/1998 → 11/11/1998|