Electron Microscopy Based Studies of Catalytically Grown Semiconductor Nanowires

Anders Gustafsson, Reine Wallenberg, Jakob Birkedal Wagner

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review

Original language	English
Title of host publication	Beam injection based nanocharacterization of advanced materials
Editors	G. Salviati, T Sekiguchi, S. Heun, A. Gustafsson
Number of pages	35
Place of Publication	Kerala, India
Publisher	Research Signpost
Publication date	2008
Pages	1-35
ISBN (Print)	978-81-308-0226-8
Publication status	Published - 2008
Externally published	Yes

OpenUrl availability

@inbook{8592aebf916247d5bf57a9015f2dfddc,

title = "Electron Microscopy Based Studies of Catalytically Grown Semiconductor Nanowires",

author = "Anders Gustafsson and Reine Wallenberg and Wagner, {Jakob Birkedal}",

year = "2008",

language = "English",

isbn = "978-81-308-0226-8",

pages = "1--35",

editor = "G. Salviati and T Sekiguchi and S. Heun and A. Gustafsson",

booktitle = "Beam injection based nanocharacterization of advanced materials",

publisher = "Research Signpost",

}

Electron Microscopy Based Studies of Catalytically Grown Semiconductor Nanowires. / Gustafsson, Anders; Wallenberg, Reine; Wagner, Jakob Birkedal.
Beam injection based nanocharacterization of advanced materials. ed. / G. Salviati; T Sekiguchi; S. Heun; A. Gustafsson. Kerala, India: Research Signpost, 2008. p. 1-35.

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review

TY - CHAP

T1 - Electron Microscopy Based Studies of Catalytically Grown Semiconductor Nanowires

AU - Gustafsson, Anders

AU - Wallenberg, Reine

AU - Wagner, Jakob Birkedal

PY - 2008

Y1 - 2008

M3 - Book chapter

SN - 978-81-308-0226-8

SP - 1

EP - 35

BT - Beam injection based nanocharacterization of advanced materials

A2 - Salviati, G.

A2 - Sekiguchi, T

A2 - Heun, S.

A2 - Gustafsson, A.

PB - Research Signpost

CY - Kerala, India

ER -