Electron micrography and x-ray study of dip-lacquered LiF (220)

J. Palmari, M. Rasigni, G. Rasigni, Finn Erland Christensen, Allan Hornstrup, H. W. Schnopper

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured ∼ 10-Å rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to ∼ 60 Å measured on the bare LiF(220) crystal surface.
    Original languageEnglish
    JournalApplied Optics
    Volume30
    Issue number25
    Pages (from-to)3667-3672
    ISSN1559-128X
    DOIs
    Publication statusPublished - 1991

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