Electron micrography and x-ray study of dip-lacquered LiF (220)

J. Palmari; M. Rasigni; G. Rasigni; Finn Erland Christensen; Allan Hornstrup; H. W. Schnopper

doi:10.1364/AO.30.003667

Electron micrography and x-ray study of dip-lacquered LiF (220)

J. Palmari, M. Rasigni, G. Rasigni, Finn Erland Christensen, Allan Hornstrup, H. W. Schnopper

National Space Institute

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured ∼ 10-Å rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to ∼ 60 Å measured on the bare LiF(220) crystal surface.

Original language	English
Journal	Applied Optics
Volume	30
Issue number	25
Pages (from-to)	3667-3672
ISSN	1559-128X
DOIs	https://doi.org/10.1364/AO.30.003667
Publication status	Published - 1991

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10.1364/AO.30.003667

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@article{00e0ee5e58f041b1a019b8fd2d69c5cf,

title = "Electron micrography and x-ray study of dip-lacquered LiF (220)",

abstract = "It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured ∼ 10-{\AA} rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to ∼ 60 {\AA} measured on the bare LiF(220) crystal surface.",

author = "J. Palmari and M. Rasigni and G. Rasigni and Christensen, {Finn Erland} and Allan Hornstrup and Schnopper, {H. W.}",

year = "1991",

doi = "10.1364/AO.30.003667",

language = "English",

volume = "30",

pages = "3667--3672",

journal = "Applied Optics",

issn = "1559-128X",

publisher = "Optical Society of America",

number = "25",

}

TY - JOUR

T1 - Electron micrography and x-ray study of dip-lacquered LiF (220)

AU - Palmari, J.

AU - Rasigni, M.

AU - Rasigni, G.

AU - Christensen, Finn Erland

AU - Hornstrup, Allan

AU - Schnopper, H. W.

PY - 1991

Y1 - 1991

N2 - It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured ∼ 10-Å rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to ∼ 60 Å measured on the bare LiF(220) crystal surface.

AB - It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured ∼ 10-Å rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to ∼ 60 Å measured on the bare LiF(220) crystal surface.

U2 - 10.1364/AO.30.003667

DO - 10.1364/AO.30.003667

M3 - Journal article

VL - 30

SP - 3667

EP - 3672

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 25

ER -

Electron micrography and x-ray study of dip-lacquered LiF (220)

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