Electron irradiation-induced destruction of carbon nanotubes in electron microscopes

Kristian Molhave; Sven Bjarke Gudnason; Anders Tegtmeier Pedersen; Casper Hyttel Clausen; Andy Horsewell; Peter Boggild

doi:10.1016/j.ultramic.2007.03.001

Electron irradiation-induced destruction of carbon nanotubes in electron microscopes

Kristian Molhave
, Sven Bjarke Gudnason
, Anders Tegtmeier Pedersen
, Casper Hyttel Clausen
, Andy Horsewell
, Peter Boggild

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	Ultramicroscopy
Volume	108
Issue number	1
Pages (from-to)	52-57
ISSN	0304-3991
DOIs	https://doi.org/10.1016/j.ultramic.2007.03.001
Publication status	Published - 2007

Keywords

electron irradiation
TEM
electron beam-induced reaction
SEM
multi-wall carbon nanotube

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10.1016/j.ultramic.2007.03.001

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Cite this

@article{7d1c6af0754a4857870a9c5bffa3bc86,

title = "Electron irradiation-induced destruction of carbon nanotubes in electron microscopes",

keywords = "electron irradiation, TEM, electron beam-induced reaction, SEM, multi-wall carbon nanotube",

author = "Kristian Molhave and Gudnason, \{Sven Bjarke\} and Pedersen, \{Anders Tegtmeier\} and Clausen, \{Casper Hyttel\} and Andy Horsewell and Peter Boggild",

year = "2007",

doi = "10.1016/j.ultramic.2007.03.001",

language = "English",

volume = "108",

pages = "52--57",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Electron irradiation-induced destruction of carbon nanotubes in electron microscopes

AU - Molhave, Kristian

AU - Gudnason, Sven Bjarke

AU - Pedersen, Anders Tegtmeier

AU - Clausen, Casper Hyttel

AU - Horsewell, Andy

AU - Boggild, Peter

PY - 2007

Y1 - 2007

KW - electron irradiation

KW - TEM

KW - electron beam-induced reaction

KW - SEM

KW - multi-wall carbon nanotube

U2 - 10.1016/j.ultramic.2007.03.001

DO - 10.1016/j.ultramic.2007.03.001

M3 - Journal article

C2 - 17445986

SN - 0304-3991

VL - 108

SP - 52

EP - 57

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1

ER -