Electron Holography and Imaging capabilities of the JEOL 2100F FEG-TEM

M. A. Schofield, Marco Beleggia, Y. Zhu

Research output: Contribution to journal › Conference article › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	11
Issue number	Supplement S02
Pages (from-to)	570-571
Number of pages	2
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S1431927605507104
Publication status	Published - 2005
Externally published	Yes
Event	Microscopy and Microanalysis 2005 - Honolulu, HI, United States Duration: 31 Jul 2005 → 4 Aug 2005

Conference	Microscopy and Microanalysis 2005
Country/Territory	United States
City	Honolulu, HI
Period	31/07/2005 → 04/08/2005

Access to Document

@inproceedings{bcd8c27832614284ae37474b2703a905,

title = "Electron Holography and Imaging capabilities of the JEOL 2100F FEG-TEM",

author = "Schofield, {M. A.} and Marco Beleggia and Y. Zhu",

year = "2005",

doi = "10.1017/S1431927605507104",

language = "English",

volume = "11",

pages = "570--571",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Supplement S02",

note = "Microscopy and Microanalysis 2005 ; Conference date: 31-07-2005 Through 04-08-2005",

}

TY - GEN

T1 - Electron Holography and Imaging capabilities of the JEOL 2100F FEG-TEM

AU - Schofield, M. A.

AU - Beleggia, Marco

AU - Zhu, Y.

PY - 2005

Y1 - 2005

U2 - 10.1017/S1431927605507104

DO - 10.1017/S1431927605507104

M3 - Conference article

VL - 11

SP - 570

EP - 571

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - Supplement S02

T2 - Microscopy and Microanalysis 2005

Y2 - 31 July 2005 through 4 August 2005

ER -