Electron Holography and Imaging capabilities of the JEOL 2100F FEG-TEM

M. A. Schofield, Marco Beleggia, Y. Zhu

Research output: Contribution to journalConference articleResearchpeer-review

Original languageEnglish
JournalMicroscopy and Microanalysis
Volume11
Issue numberSupplement S02
Pages (from-to)570-571
Number of pages2
ISSN1431-9276
DOIs
Publication statusPublished - 2005
Externally publishedYes
EventMicroscopy and Microanalysis 2005 - Honolulu, HI, United States
Duration: 31 Jul 20054 Aug 2005

Conference

ConferenceMicroscopy and Microanalysis 2005
CountryUnited States
CityHonolulu, HI
Period31/07/200504/08/2005

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