Electron-beam-induced dynamic charging of thin films

Marco Beleggia, V. Migunov, R.E. Dunin-Borkowski

    Research output: Contribution to conferencePosterResearchpeer-review

    101 Downloads (Pure)
    Original languageEnglish
    Publication date2015
    Number of pages1
    Publication statusPublished - 2015
    Event3rd Conference on Frontiers of Aberration Corrected Electron Microscopy - Kasteel Vaalsbroek, Netherlands
    Duration: 19 Apr 201523 Apr 2015
    Conference number: 3
    http://www.er-c.org/pico2015/about.htm

    Conference

    Conference3rd Conference on Frontiers of Aberration Corrected Electron Microscopy
    Number3
    CountryNetherlands
    CityKasteel Vaalsbroek
    Period19/04/201523/04/2015
    Internet address

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