Electron-beam-induced dynamic charging of thin films

Marco Beleggia, V. Migunov, R.E. Dunin-Borkowski

Research output: Contribution to conference › Poster › Research › peer-review

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Original language	English
Publication date	2015
Number of pages	1
Publication status	Published - 2015
Event	3rd Conference on Frontiers of Aberration Corrected Electron Microscopy - Kasteel Vaalsbroek, Netherlands Duration: 19 Apr 2015 → 23 Apr 2015 Conference number: 3 http://www.er-c.org/pico2015/about.htm

Conference	3rd Conference on Frontiers of Aberration Corrected Electron Microscopy
Number	3
Country/Territory	Netherlands
City	Kasteel Vaalsbroek
Period	19/04/2015 → 23/04/2015
Internet address	http://www.er-c.org/pico2015/about.htm

Access to Document

@conference{f82cbcd03c32413c8f359ce7442ca8fa,

title = "Electron-beam-induced dynamic charging of thin films",

author = "Marco Beleggia and V. Migunov and R.E. Dunin-Borkowski",

year = "2015",

language = "English",

note = "3rd Conference on Frontiers of Aberration Corrected Electron Microscopy, PICO 2015 ; Conference date: 19-04-2015 Through 23-04-2015",

url = "http://www.er-c.org/pico2015/about.htm",

}