Electron beam-induced charging and modifications of thin films

Marco Beleggia, M. Malac, T. Rowan, R. Egerton, M. Kawasaki, Y. Okura, R. McLeod

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research › peer-review

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Original language	English
Title of host publication	Proceedings of Microscopy and Microanalysis 2015
Number of pages	2
Publication date	2015
Publication status	Published - 2015
Event	Microscopy and Microanalysis 2015 - Portland, United States Duration: 2 Aug 2015 → 6 Aug 2015

Conference	Microscopy and Microanalysis 2015
Country/Territory	United States
City	Portland
Period	02/08/2015 → 06/08/2015

Access to Document

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title = "Electron beam-induced charging and modifications of thin films",

author = "Marco Beleggia and M. Malac and T. Rowan and R. Egerton and M. Kawasaki and Y. Okura and R. McLeod",

year = "2015",

language = "English",

booktitle = "Proceedings of Microscopy and Microanalysis 2015",

note = "Microscopy and Microanalysis 2015 ; Conference date: 02-08-2015 Through 06-08-2015",

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TY - ABST

T1 - Electron beam-induced charging and modifications of thin films

AU - Beleggia, Marco

AU - Malac, M.

AU - Rowan, T.

AU - Egerton, R.

AU - Kawasaki, M.

AU - Okura, Y.

AU - McLeod, R.

PY - 2015

Y1 - 2015

M3 - Conference abstract in proceedings

BT - Proceedings of Microscopy and Microanalysis 2015

T2 - Microscopy and Microanalysis 2015

Y2 - 2 August 2015 through 6 August 2015

ER -