Electron beam-induced charging and modifications of thin films

Marco Beleggia, M. Malac, T. Rowan, R. Egerton, M. Kawasaki, Y. Okura, R. McLeod

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearchpeer-review

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    Original languageEnglish
    Title of host publicationProceedings of Microscopy and Microanalysis 2015
    Number of pages2
    Publication date2015
    Publication statusPublished - 2015
    EventMicroscopy and Microanalysis 2015 - Portland, United States
    Duration: 2 Aug 20156 Aug 2015


    ConferenceMicroscopy and Microanalysis 2015
    Country/TerritoryUnited States

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