Electron back scattering diffraction in the scanning electron microscope

Jørgen Bilde-Sørensen

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	2000
Publication status	Published - 2000
Event	SEM 2000: Scanning Electron Microscopy - imaging and microanalysis - Chalmers Technical University, Göteborg, Sweden Duration: 17 Oct 2000 → 19 Oct 2000

Course	SEM 2000: Scanning Electron Microscopy - imaging and microanalysis
Location	Chalmers Technical University
Country/Territory	Sweden
City	Göteborg
Period	17/10/2000 → 19/10/2000

OpenUrl availability

@conference{e72ff72bc78b4153b1dc1e6b438cc7f6,

title = "Electron back scattering diffraction in the scanning electron microscope",

keywords = "Industrielle materialer",

author = "J{\o}rgen Bilde-S{\o}rensen",

year = "2000",

language = "English",

note = "SEM 2000: Scanning Electron Microscopy - imaging and microanalysis ; Conference date: 17-10-2000 Through 19-10-2000",

}