Electrical Contact Formation in Micro Four‐Point Probe Measurements

Steven Folkersma*, Janusz Bogdanowicz, Dirch Hjorth Petersen, Ole Hansen, Henrik Hartmann Henrichsen, Peter Former Nielsen, Lior Shiv, Wilfried Vandervorst

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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