Electrical characterization of nanowires combined with in-situ TEM imaging

Sardar Bilal Alam, Christopher Røhl Andersen, Federico Panciera, Ole Hansen, Frances M. Ross, Nika Akopian, Kimberly Dick Thelander, Kristian Mølhave

Research output: Contribution to conferencePosterResearchpeer-review

70 Downloads (Pure)
Original languageEnglish
Publication date2019
Publication statusPublished - 2019
EventNanowire Week 2019 - Pisa, Italy
Duration: 23 Sep 201927 Sep 2019

Conference

ConferenceNanowire Week 2019
CountryItaly
CityPisa
Period23/09/201927/09/2019

Keywords

  • Si
  • III-V nanowires
  • MEMS
  • In-situ TEM
  • Electrical properties

Cite this

Alam, S. B., Andersen, C. R., Panciera, F., Hansen, O., Ross, F. M., Akopian, N., Thelander, K. D., & Mølhave, K. (2019). Electrical characterization of nanowires combined with in-situ TEM imaging. Poster session presented at Nanowire Week 2019, Pisa, Italy.