Electrical characterization of nanowires combined with in-situ TEM imaging

Sardar Bilal Alam, Christopher Røhl Andersen, Federico Panciera, Ole Hansen, Frances M. Ross, Nika Akopian, Kimberly Dick Thelander, Kristian Mølhave

Research output: Contribution to conferencePosterResearchpeer-review

21 Downloads (Pure)
Original languageEnglish
Publication date2019
Publication statusPublished - 2019
EventNanowire Week 2019 - Pisa, Italy
Duration: 23 Sep 201927 Sep 2019

Conference

ConferenceNanowire Week 2019
CountryItaly
CityPisa
Period23/09/201927/09/2019

Keywords

  • Si
  • III-V nanowires
  • MEMS
  • In-situ TEM
  • Electrical properties

Cite this

Alam, S. B., Andersen, C. R., Panciera, F., Hansen, O., Ross, F. M., Akopian, N., ... Mølhave, K. (2019). Electrical characterization of nanowires combined with in-situ TEM imaging. Poster session presented at Nanowire Week 2019, Pisa, Italy.
Alam, Sardar Bilal ; Andersen, Christopher Røhl ; Panciera, Federico ; Hansen, Ole ; Ross, Frances M. ; Akopian, Nika ; Thelander, Kimberly Dick ; Mølhave, Kristian. / Electrical characterization of nanowires combined with in-situ TEM imaging. Poster session presented at Nanowire Week 2019, Pisa, Italy.
@conference{b2c99f4d516b41c58aecbf4cb2383bdb,
title = "Electrical characterization of nanowires combined with in-situ TEM imaging",
keywords = "Si, III-V nanowires, MEMS, In-situ TEM, Electrical properties",
author = "Alam, {Sardar Bilal} and Andersen, {Christopher R{\o}hl} and Federico Panciera and Ole Hansen and Ross, {Frances M.} and Nika Akopian and Thelander, {Kimberly Dick} and Kristian M{\o}lhave",
year = "2019",
language = "English",
note = "Nanowire Week 2019 ; Conference date: 23-09-2019 Through 27-09-2019",

}

Alam, SB, Andersen, CR, Panciera, F, Hansen, O, Ross, FM, Akopian, N, Thelander, KD & Mølhave, K 2019, 'Electrical characterization of nanowires combined with in-situ TEM imaging' Nanowire Week 2019, Pisa, Italy, 23/09/2019 - 27/09/2019, .

Electrical characterization of nanowires combined with in-situ TEM imaging. / Alam, Sardar Bilal ; Andersen, Christopher Røhl; Panciera, Federico; Hansen, Ole; Ross, Frances M.; Akopian, Nika; Thelander, Kimberly Dick ; Mølhave, Kristian.

2019. Poster session presented at Nanowire Week 2019, Pisa, Italy.

Research output: Contribution to conferencePosterResearchpeer-review

TY - CONF

T1 - Electrical characterization of nanowires combined with in-situ TEM imaging

AU - Alam, Sardar Bilal

AU - Andersen, Christopher Røhl

AU - Panciera, Federico

AU - Hansen, Ole

AU - Ross, Frances M.

AU - Akopian, Nika

AU - Thelander, Kimberly Dick

AU - Mølhave, Kristian

PY - 2019

Y1 - 2019

KW - Si

KW - III-V nanowires

KW - MEMS

KW - In-situ TEM

KW - Electrical properties

M3 - Poster

ER -

Alam SB, Andersen CR, Panciera F, Hansen O, Ross FM, Akopian N et al. Electrical characterization of nanowires combined with in-situ TEM imaging. 2019. Poster session presented at Nanowire Week 2019, Pisa, Italy.