Efficient formation of extended line intensity patterns using matched-filtering generalized phase contrast

Andrew Rafael Bañas; Darwin Palima; Thomas Aabo; Jesper Glückstad

doi:10.1117/12.2003912

Efficient formation of extended line intensity patterns using matched-filtering generalized phase contrast

Andrew Rafael Bañas
, Darwin Palima
, Thomas Aabo
, Jesper Glückstad

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

We demonstrate the efficient generation of line patterns using matched-filtering Generalized Phase Contrast (mGPC). So far, the main emphasis of mGPC light addressing has been on the creation of rapidly reconfigurable focused spots. This has recently been extended to encoding extended line patterns for structured light applications and advanced microscopy. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

Original language	English
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8637
Pages (from-to)	86370J
Number of pages	6
ISSN	0277-786X
DOIs	https://doi.org/10.1117/12.2003912
Publication status	Published - 2013
Event	SPIE Photonics West OPTO 2013 - The Moscone Center, San Francisco, United States Duration: 2 Feb 2013 → 7 Feb 2013 http://spie.org/x90760.xml

Conference

Conference	SPIE Photonics West OPTO 2013
Location	The Moscone Center
Country/Territory	United States
City	San Francisco
Period	02/02/2013 → 07/02/2013
Internet address	http://spie.org/x90760.xml

Keywords

Computer programming
Microscopy
Phase contrast

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10.1117/12.2003912

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title = "Efficient formation of extended line intensity patterns using matched-filtering generalized phase contrast",

abstract = "We demonstrate the efficient generation of line patterns using matched-filtering Generalized Phase Contrast (mGPC). So far, the main emphasis of mGPC light addressing has been on the creation of rapidly reconfigurable focused spots. This has recently been extended to encoding extended line patterns for structured light applications and advanced microscopy. {\textcopyright} (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. ",

keywords = "Computer programming, Microscopy, Phase contrast",

author = "Ba{\~n}as, \{Andrew Rafael\} and Darwin Palima and Thomas Aabo and Jesper Gl{\"u}ckstad",

year = "2013",

doi = "10.1117/12.2003912",

language = "English",

volume = "8637",

pages = "86370J",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "SPIE Photonics West OPTO 2013 ; Conference date: 02-02-2013 Through 07-02-2013",

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TY - GEN

T1 - Efficient formation of extended line intensity patterns using matched-filtering generalized phase contrast

AU - Bañas, Andrew Rafael

AU - Palima, Darwin

AU - Aabo, Thomas

AU - Glückstad, Jesper

PY - 2013

Y1 - 2013

N2 - We demonstrate the efficient generation of line patterns using matched-filtering Generalized Phase Contrast (mGPC). So far, the main emphasis of mGPC light addressing has been on the creation of rapidly reconfigurable focused spots. This has recently been extended to encoding extended line patterns for structured light applications and advanced microscopy. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

AB - We demonstrate the efficient generation of line patterns using matched-filtering Generalized Phase Contrast (mGPC). So far, the main emphasis of mGPC light addressing has been on the creation of rapidly reconfigurable focused spots. This has recently been extended to encoding extended line patterns for structured light applications and advanced microscopy. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

KW - Computer programming

KW - Microscopy

KW - Phase contrast

U2 - 10.1117/12.2003912

DO - 10.1117/12.2003912

M3 - Conference article

SN - 0277-786X

VL - 8637

SP - 86370J

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - SPIE Photonics West OPTO 2013

Y2 - 2 February 2013 through 7 February 2013

ER -

Efficient formation of extended line intensity patterns using matched-filtering generalized phase contrast

Abstract

Conference

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