Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges

Jakob Wilm, Daniel González Madruga, Janus Nørtoft Jensen, Søren Kimmer Schou Gregersen, Mads Emil Brix Doest, Maria Grazia Guerra, Henrik Aanæs, Leonardo De Chiffre

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Abstract

We present a study on the effects of sub-surface scattering quantified by means of uni- and bidirectional distance measurements on miniature step gauges, which were manufactured in four different polymer materials (POM, PEEK, PPS and ABS), and calibrated using a coordinate measuring machine. Measurement were performed using an own developed structured light 3D scanner, which provides detailed knowledge of the scan process and allows access to raw data and unbiased evaluation of the sub-surface effects. Analysis was carried out with the CMM measurement strategy adapted to optical data in the software GOM Inspect. Results show bidirectional deviations (optical measurement compared to CMM) in the order of 100m to 800m (material dependent) and consistently higher than corresponding unidirectional measurements, indicating a systematic error induced by the light-material interaction. We hypothesize that part of these effects can be accounted for, enabling optical measurements of a wider range of materials.
Original languageEnglish
Title of host publicationProceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology
EditorsD. Billington, R. K. Leach, D. Phillips, O. Riemer, E. Savio
PublisherThe European Society for Precision Engineering and Nanotechnology
Publication date2018
Pages449-450
ISBN (Electronic)9780995775121
Publication statusPublished - 2018
Event18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18) - Venice, Italy
Duration: 4 Jun 20188 Jun 2018

Conference

Conference18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)
CountryItaly
CityVenice
Period04/06/201808/06/2018

Keywords

  • Optical metrology
  • 3D scanning
  • Dimensional Accuracy
  • Polymers

Cite this

Wilm, J., Madruga, D. G., Jensen, J. N., Gregersen, S. K. S., Doest, M. E. B., Guerra, M. G., ... De Chiffre, L. (2018). Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges. In D. Billington, R. K. Leach, D. Phillips, O. Riemer, & E. Savio (Eds.), Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology (pp. 449-450). The European Society for Precision Engineering and Nanotechnology.
Wilm, Jakob ; Madruga, Daniel González ; Jensen, Janus Nørtoft ; Gregersen, Søren Kimmer Schou ; Doest, Mads Emil Brix ; Guerra, Maria Grazia ; Aanæs, Henrik ; De Chiffre, Leonardo. / Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges. Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology. editor / D. Billington ; R. K. Leach ; D. Phillips ; O. Riemer ; E. Savio. The European Society for Precision Engineering and Nanotechnology, 2018. pp. 449-450
@inbook{4ec1fe50e7eb44ef8def6beda94b4d02,
title = "Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges",
abstract = "We present a study on the effects of sub-surface scattering quantified by means of uni- and bidirectional distance measurements on miniature step gauges, which were manufactured in four different polymer materials (POM, PEEK, PPS and ABS), and calibrated using a coordinate measuring machine. Measurement were performed using an own developed structured light 3D scanner, which provides detailed knowledge of the scan process and allows access to raw data and unbiased evaluation of the sub-surface effects. Analysis was carried out with the CMM measurement strategy adapted to optical data in the software GOM Inspect. Results show bidirectional deviations (optical measurement compared to CMM) in the order of 100m to 800m (material dependent) and consistently higher than corresponding unidirectional measurements, indicating a systematic error induced by the light-material interaction. We hypothesize that part of these effects can be accounted for, enabling optical measurements of a wider range of materials.",
keywords = "Optical metrology, 3D scanning, Dimensional Accuracy, Polymers",
author = "Jakob Wilm and Madruga, {Daniel Gonz{\'a}lez} and Jensen, {Janus N{\o}rtoft} and Gregersen, {S{\o}ren Kimmer Schou} and Doest, {Mads Emil Brix} and Guerra, {Maria Grazia} and Henrik Aan{\ae}s and {De Chiffre}, Leonardo",
year = "2018",
language = "English",
pages = "449--450",
editor = "Billington, {D. } and Leach, {R. K.} and Phillips, {D. } and Riemer, {O. } and Savio, {E. }",
booktitle = "Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology",
publisher = "The European Society for Precision Engineering and Nanotechnology",

}

Wilm, J, Madruga, DG, Jensen, JN, Gregersen, SKS, Doest, MEB, Guerra, MG, Aanæs, H & De Chiffre, L 2018, Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges. in D Billington, RK Leach, D Phillips, O Riemer & E Savio (eds), Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology. The European Society for Precision Engineering and Nanotechnology, pp. 449-450, 18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18), Venice, Italy, 04/06/2018.

Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges. / Wilm, Jakob; Madruga, Daniel González; Jensen, Janus Nørtoft; Gregersen, Søren Kimmer Schou; Doest, Mads Emil Brix; Guerra, Maria Grazia; Aanæs, Henrik; De Chiffre, Leonardo.

Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology. ed. / D. Billington; R. K. Leach; D. Phillips; O. Riemer; E. Savio. The European Society for Precision Engineering and Nanotechnology, 2018. p. 449-450.

Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearchpeer-review

TY - ABST

T1 - Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges

AU - Wilm, Jakob

AU - Madruga, Daniel González

AU - Jensen, Janus Nørtoft

AU - Gregersen, Søren Kimmer Schou

AU - Doest, Mads Emil Brix

AU - Guerra, Maria Grazia

AU - Aanæs, Henrik

AU - De Chiffre, Leonardo

PY - 2018

Y1 - 2018

N2 - We present a study on the effects of sub-surface scattering quantified by means of uni- and bidirectional distance measurements on miniature step gauges, which were manufactured in four different polymer materials (POM, PEEK, PPS and ABS), and calibrated using a coordinate measuring machine. Measurement were performed using an own developed structured light 3D scanner, which provides detailed knowledge of the scan process and allows access to raw data and unbiased evaluation of the sub-surface effects. Analysis was carried out with the CMM measurement strategy adapted to optical data in the software GOM Inspect. Results show bidirectional deviations (optical measurement compared to CMM) in the order of 100m to 800m (material dependent) and consistently higher than corresponding unidirectional measurements, indicating a systematic error induced by the light-material interaction. We hypothesize that part of these effects can be accounted for, enabling optical measurements of a wider range of materials.

AB - We present a study on the effects of sub-surface scattering quantified by means of uni- and bidirectional distance measurements on miniature step gauges, which were manufactured in four different polymer materials (POM, PEEK, PPS and ABS), and calibrated using a coordinate measuring machine. Measurement were performed using an own developed structured light 3D scanner, which provides detailed knowledge of the scan process and allows access to raw data and unbiased evaluation of the sub-surface effects. Analysis was carried out with the CMM measurement strategy adapted to optical data in the software GOM Inspect. Results show bidirectional deviations (optical measurement compared to CMM) in the order of 100m to 800m (material dependent) and consistently higher than corresponding unidirectional measurements, indicating a systematic error induced by the light-material interaction. We hypothesize that part of these effects can be accounted for, enabling optical measurements of a wider range of materials.

KW - Optical metrology

KW - 3D scanning

KW - Dimensional Accuracy

KW - Polymers

M3 - Conference abstract in proceedings

SP - 449

EP - 450

BT - Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology

A2 - Billington, D.

A2 - Leach, R. K.

A2 - Phillips, D.

A2 - Riemer, O.

A2 - Savio, E.

PB - The European Society for Precision Engineering and Nanotechnology

ER -

Wilm J, Madruga DG, Jensen JN, Gregersen SKS, Doest MEB, Guerra MG et al. Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges. In Billington D, Leach RK, Phillips D, Riemer O, Savio E, editors, Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology. The European Society for Precision Engineering and Nanotechnology. 2018. p. 449-450