Abstract
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology |
| Editors | D. Billington, R. K. Leach, D. Phillips, O. Riemer, E. Savio |
| Publisher | The European Society for Precision Engineering and Nanotechnology |
| Publication date | 2018 |
| Pages | 449-450 |
| ISBN (Electronic) | 9780995775121 |
| Publication status | Published - 2018 |
| Event | 18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18) - Venice, Italy Duration: 4 Jun 2018 → 8 Jun 2018 |
Conference
| Conference | 18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18) |
|---|---|
| Country | Italy |
| City | Venice |
| Period | 04/06/2018 → 08/06/2018 |
Keywords
- Optical metrology
- 3D scanning
- Dimensional Accuracy
- Polymers
Cite this
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Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges. / Wilm, Jakob; Madruga, Daniel González; Jensen, Janus Nørtoft; Gregersen, Søren Kimmer Schou; Doest, Mads Emil Brix; Guerra, Maria Grazia; Aanæs, Henrik; De Chiffre, Leonardo.
Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology. ed. / D. Billington; R. K. Leach; D. Phillips; O. Riemer; E. Savio. The European Society for Precision Engineering and Nanotechnology, 2018. p. 449-450.Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research › peer-review
TY - ABST
T1 - Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges
AU - Wilm, Jakob
AU - Madruga, Daniel González
AU - Jensen, Janus Nørtoft
AU - Gregersen, Søren Kimmer Schou
AU - Doest, Mads Emil Brix
AU - Guerra, Maria Grazia
AU - Aanæs, Henrik
AU - De Chiffre, Leonardo
PY - 2018
Y1 - 2018
N2 - We present a study on the effects of sub-surface scattering quantified by means of uni- and bidirectional distance measurements on miniature step gauges, which were manufactured in four different polymer materials (POM, PEEK, PPS and ABS), and calibrated using a coordinate measuring machine. Measurement were performed using an own developed structured light 3D scanner, which provides detailed knowledge of the scan process and allows access to raw data and unbiased evaluation of the sub-surface effects. Analysis was carried out with the CMM measurement strategy adapted to optical data in the software GOM Inspect. Results show bidirectional deviations (optical measurement compared to CMM) in the order of 100m to 800m (material dependent) and consistently higher than corresponding unidirectional measurements, indicating a systematic error induced by the light-material interaction. We hypothesize that part of these effects can be accounted for, enabling optical measurements of a wider range of materials.
AB - We present a study on the effects of sub-surface scattering quantified by means of uni- and bidirectional distance measurements on miniature step gauges, which were manufactured in four different polymer materials (POM, PEEK, PPS and ABS), and calibrated using a coordinate measuring machine. Measurement were performed using an own developed structured light 3D scanner, which provides detailed knowledge of the scan process and allows access to raw data and unbiased evaluation of the sub-surface effects. Analysis was carried out with the CMM measurement strategy adapted to optical data in the software GOM Inspect. Results show bidirectional deviations (optical measurement compared to CMM) in the order of 100m to 800m (material dependent) and consistently higher than corresponding unidirectional measurements, indicating a systematic error induced by the light-material interaction. We hypothesize that part of these effects can be accounted for, enabling optical measurements of a wider range of materials.
KW - Optical metrology
KW - 3D scanning
KW - Dimensional Accuracy
KW - Polymers
M3 - Conference abstract in proceedings
SP - 449
EP - 450
BT - Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology
A2 - Billington, D.
A2 - Leach, R. K.
A2 - Phillips, D.
A2 - Riemer, O.
A2 - Savio, E.
PB - The European Society for Precision Engineering and Nanotechnology
ER -