Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell

Antonio Rizzo; Andrea Cester; Lorenzo Torto; Marco Barbato; Nicola Wrachien; Nicolo Lago; Michael Corazza; Frederik C Krebs; Suren Gevorgyan

doi:10.1109/IRPS.2016.7574523

Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell

Antonio Rizzo, Andrea Cester, Lorenzo Torto, Marco Barbato, Nicola Wrachien, Nicolo Lago, Michael Corazza, Frederik C Krebs, Suren Gevorgyan

Department of Energy Conversion and Storage

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

We subjected P3HT:PCBM solar cells to electrical constant current stress and thermal storage. We employed the impedance spectroscopy technique combined to conventional DC measurements for device characterization during all stresses. We identified and separated different contributions affecting the open circuit voltage and short circuit current. Several mechanisms are behind these changes during the stresses; in particular, we underlined the exciton recombination rate and the variation of the built-in voltage.

Original language	English
Title of host publication	2016 International Reliability Physics Symposium (IRPS)
Number of pages	6
Publisher	IEEE
Publication date	2016
ISBN (Print)	978-1-4673-9138-2
ISBN (Electronic)	978-1-4673-9137-5
DOIs	https://doi.org/10.1109/IRPS.2016.7574523
Publication status	Published - 2016
Event	2016 IEEE International Reliability Physics Symposium - Pasadena, United States Duration: 17 Apr 2016 → 21 Apr 2016 http://irps.org/2016/

Conference

Conference	2016 IEEE International Reliability Physics Symposium
Country	United States
City	Pasadena
Period	17/04/2016 → 21/04/2016
Internet address	http://irps.org/2016/

Series	I E E E International Reliability Physics Symposium. Proceedings
ISSN	1541-7026

Keywords

Stress
Solar cell
Heterojunctions
Current
Thermal stability

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Rizzo, A., Cester, A., Torto, L., Barbato, M., Wrachien, N., Lago, N., Corazza, M., Krebs, F. C., & Gevorgyan, S. (2016). Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell. In 2016 International Reliability Physics Symposium (IRPS) IEEE. I E E E International Reliability Physics Symposium. Proceedings https://doi.org/10.1109/IRPS.2016.7574523

Rizzo, Antonio ; Cester, Andrea ; Torto, Lorenzo ; Barbato, Marco ; Wrachien, Nicola ; Lago, Nicolo ; Corazza, Michael ; Krebs, Frederik C ; Gevorgyan, Suren. / Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell. 2016 International Reliability Physics Symposium (IRPS). IEEE, 2016. (I E E E International Reliability Physics Symposium. Proceedings).

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title = "Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell",

abstract = "We subjected P3HT:PCBM solar cells to electrical constant current stress and thermal storage. We employed the impedance spectroscopy technique combined to conventional DC measurements for device characterization during all stresses. We identified and separated different contributions affecting the open circuit voltage and short circuit current. Several mechanisms are behind these changes during the stresses; in particular, we underlined the exciton recombination rate and the variation of the built-in voltage.",

keywords = "Stress, Solar cell, Heterojunctions, Current, Thermal stability",

author = "Antonio Rizzo and Andrea Cester and Lorenzo Torto and Marco Barbato and Nicola Wrachien and Nicolo Lago and Michael Corazza and Krebs, {Frederik C} and Suren Gevorgyan",

year = "2016",

doi = "10.1109/IRPS.2016.7574523",

language = "English",

isbn = "978-1-4673-9138-2",

series = "I E E E International Reliability Physics Symposium. Proceedings",

booktitle = "2016 International Reliability Physics Symposium (IRPS)",

publisher = "IEEE",

address = "United States",

note = "2016 IEEE International Reliability Physics Symposium, IRPS 2016 ; Conference date: 17-04-2016 Through 21-04-2016",

url = "http://irps.org/2016/",

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Rizzo, A, Cester, A, Torto, L, Barbato, M, Wrachien, N, Lago, N, Corazza, M, Krebs, FC & Gevorgyan, S 2016, Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell. in 2016 International Reliability Physics Symposium (IRPS). IEEE, I E E E International Reliability Physics Symposium. Proceedings, 2016 IEEE International Reliability Physics Symposium, Pasadena, United States, 17/04/2016. https://doi.org/10.1109/IRPS.2016.7574523

Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell. / Rizzo, Antonio; Cester, Andrea; Torto, Lorenzo; Barbato, Marco; Wrachien, Nicola; Lago, Nicolo; Corazza, Michael; Krebs, Frederik C; Gevorgyan, Suren.

2016 International Reliability Physics Symposium (IRPS). IEEE, 2016. (I E E E International Reliability Physics Symposium. Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell

AU - Rizzo, Antonio

AU - Cester, Andrea

AU - Torto, Lorenzo

AU - Barbato, Marco

AU - Wrachien, Nicola

AU - Lago, Nicolo

AU - Corazza, Michael

AU - Krebs, Frederik C

AU - Gevorgyan, Suren

PY - 2016

Y1 - 2016

N2 - We subjected P3HT:PCBM solar cells to electrical constant current stress and thermal storage. We employed the impedance spectroscopy technique combined to conventional DC measurements for device characterization during all stresses. We identified and separated different contributions affecting the open circuit voltage and short circuit current. Several mechanisms are behind these changes during the stresses; in particular, we underlined the exciton recombination rate and the variation of the built-in voltage.

AB - We subjected P3HT:PCBM solar cells to electrical constant current stress and thermal storage. We employed the impedance spectroscopy technique combined to conventional DC measurements for device characterization during all stresses. We identified and separated different contributions affecting the open circuit voltage and short circuit current. Several mechanisms are behind these changes during the stresses; in particular, we underlined the exciton recombination rate and the variation of the built-in voltage.

KW - Stress

KW - Solar cell

KW - Heterojunctions

KW - Current

KW - Thermal stability

U2 - 10.1109/IRPS.2016.7574523

DO - 10.1109/IRPS.2016.7574523

M3 - Article in proceedings

SN - 978-1-4673-9138-2

T3 - I E E E International Reliability Physics Symposium. Proceedings

BT - 2016 International Reliability Physics Symposium (IRPS)

PB - IEEE

T2 - 2016 IEEE International Reliability Physics Symposium

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