We subjected P3HT:PCBM solar cells to electrical constant current stress and thermal storage. We employed the impedance spectroscopy technique combined to conventional DC measurements for device characterization during all stresses. We identified and separated different contributions affecting the open circuit voltage and short circuit current. Several mechanisms are behind these changes during the stresses; in particular, we underlined the exciton recombination rate and the variation of the built-in voltage.
|Conference||2016 IEEE International Reliability Physics Symposium|
|Period||17/04/2016 → 21/04/2016|
|Series||I E E E International Reliability Physics Symposium. Proceedings|
- Solar cell
- Thermal stability