Effective carrier sweepout in a silicon waveguide by a metal-semiconductor-metal structure

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedings – Annual report year: 2015Researchpeer-review

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We demonstrate effective carrier depletion by metal-semiconductor-metal junctions for a silicon waveguide. Photo-generated carriers are efficiently swept out by applying bias voltages, and a shortest carrier lifetime of only 55 ps is demonstrated.
Original languageEnglish
Title of host publicationProceedings of 2015 Conference on Lasers and Electro-Optics (CLEO)
Number of pages2
PublisherIEEE
Publication date2015
ISBN (Print)978-1-55752-968-8
DOIs
Publication statusPublished - 2015
Event2015 Conference on Lasers and Electro-Optics 2015 (CLEO) - San Jose Convention Center, San Jose, CA, United States
Duration: 10 May 201515 May 2015

Conference

Conference2015 Conference on Lasers and Electro-Optics 2015 (CLEO)
LocationSan Jose Convention Center
CountryUnited States
CitySan Jose, CA
Period10/05/201515/05/2015

Bibliographical note

From the session: Silicon Photonics (SM1I)

CitationsWeb of Science® Times Cited: No match on DOI

ID: 110763152