Abstract
| Original language | English |
|---|---|
| Title of host publication | Anomaly Detection and Imaging with X-Rays (ADIX) IV |
| Editors | Amit Ashok , Joel A. Greenburg , Michael E. Gehm |
| Number of pages | 11 |
| Volume | 10999 |
| Publisher | SPIE - International Society for Optical Engineering |
| Publication date | 2019 |
| Article number | 1099903 |
| DOIs | |
| Publication status | Published - 2019 |
| Event | SPIE Defense + Commercial Sensing 2019 - Baltimore, United States Duration: 14 Apr 2019 → 18 Apr 2019 |
Conference
| Conference | SPIE Defense + Commercial Sensing 2019 |
|---|---|
| Country | United States |
| City | Baltimore |
| Period | 14/04/2019 → 18/04/2019 |
| Series | Proceedings of S P I E - International Society for Optical Engineering |
|---|---|
| ISSN | 0277-786X |
Keywords
- Spectral X-ray CT
- X-ray characterization
- Effective atomic number
- Electron density
- MULTIX-ME100
- Therat detection
- Security screening
Cite this
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Effective atomic number and electron density determination using spectral X-ray CT. / Busi, Matteo; Kehres, Jan; Khalil, Mohamad; Olsen, Ulrik Lund.
Anomaly Detection and Imaging with X-Rays (ADIX) IV. ed. / Amit Ashok; Joel A. Greenburg; Michael E. Gehm. Vol. 10999 SPIE - International Society for Optical Engineering, 2019. 1099903 (Proceedings of S P I E - International Society for Optical Engineering).Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
TY - GEN
T1 - Effective atomic number and electron density determination using spectral X-ray CT
AU - Busi, Matteo
AU - Kehres, Jan
AU - Khalil, Mohamad
AU - Olsen, Ulrik Lund
PY - 2019
Y1 - 2019
N2 - We present Spectral X-ray Computed Tomography (SCT) estimations of material properties directly from energy-dependent measurements of linear attenuation coefficients (LAC). X-ray Computed Tomography (CT) is commonly utilized to characterize the internal properties of an object of interest. Dual-Energy X-ray CT allows material characterization into energy-independent physical properties such as Ze and electron density ρe. However, it is not robust in presence of dense materials and metal artifacts. We report on the performance of a method for system-independent characterization of materials that introduces a spectroscopic detector into X-ray CT, called spectral ρe/Ze estimation (SRZE). We benchmark the SRZE method against energy-integrated measurements in material classification tests, finding superior accuracy in the predictions. The advantage of this technique, over other methods for material characterization using x-ray CT, is that it does not require a set of reference materials for calibration. Moreover, the simultaneous detection of spectral features makes it robust to highly attenuating materials, since the energy intervals for which the attenuation is photon limited can easily be detected and excluded from the feature estimation.
AB - We present Spectral X-ray Computed Tomography (SCT) estimations of material properties directly from energy-dependent measurements of linear attenuation coefficients (LAC). X-ray Computed Tomography (CT) is commonly utilized to characterize the internal properties of an object of interest. Dual-Energy X-ray CT allows material characterization into energy-independent physical properties such as Ze and electron density ρe. However, it is not robust in presence of dense materials and metal artifacts. We report on the performance of a method for system-independent characterization of materials that introduces a spectroscopic detector into X-ray CT, called spectral ρe/Ze estimation (SRZE). We benchmark the SRZE method against energy-integrated measurements in material classification tests, finding superior accuracy in the predictions. The advantage of this technique, over other methods for material characterization using x-ray CT, is that it does not require a set of reference materials for calibration. Moreover, the simultaneous detection of spectral features makes it robust to highly attenuating materials, since the energy intervals for which the attenuation is photon limited can easily be detected and excluded from the feature estimation.
KW - Spectral X-ray CT
KW - X-ray characterization
KW - Effective atomic number
KW - Electron density
KW - MULTIX-ME100
KW - Therat detection
KW - Security screening
U2 - 10.1117/12.2519851
DO - 10.1117/12.2519851
M3 - Article in proceedings
VL - 10999
T3 - Proceedings of S P I E - International Society for Optical Engineering
BT - Anomaly Detection and Imaging with X-Rays (ADIX) IV
A2 - , Amit Ashok
A2 - , Joel A. Greenburg
A2 - , Michael E. Gehm
PB - SPIE - International Society for Optical Engineering
ER -