Effect of Semicon-Dielectric Interface on Conductivity and Electric Field Distribution

J. Hjerrild, Joachim Holbøll, Mogens Henriksen, S. Boggs

    Research output: Contribution to journalJournal articleResearchpeer-review

    502 Downloads (Orbit)

    Abstract

    Development of solid dielectric dc transmission class cable has become a priority throughout much of the world. Interdiffusion between the semiconducting electrode materials and the dielectric inevitably causes variations in conductivity of the dielectric near the semicon which results in distortion of the electric field and space charge formation under dc conditions. Analytical approximations and numerical computations provide a basis for analyzing space charge measurements, and based on such space charge measurements and the analysis, we estimate the field distortion for several material systems.
    Original languageEnglish
    JournalIEEE Transactions on Dielectrics and Electrical Insulation
    Volume9
    Issue number4
    Pages (from-to)596-603
    ISSN1070-9878
    DOIs
    Publication statusPublished - 2002

    Bibliographical note

    Copyright: 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

    Fingerprint

    Dive into the research topics of 'Effect of Semicon-Dielectric Interface on Conductivity and Electric Field Distribution'. Together they form a unique fingerprint.

    Cite this