EBSD contra TEM characterization of a deformed aluminum single crystal

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review

Original language	English
Title of host publication	Electron backscatter diffraction in materials science
Editors	A.J. Schwartz, M. Kumar, B.L. Adams
Place of Publication	New York
Publisher	Kluwer Academic
Publication date	2001
ISBN (Print)	0-306-46487-X
Publication status	Published - 2001

OpenUrl availability

@inbook{70f24364598f46e6b6b9af4ce161b9c6,

title = "EBSD contra TEM characterization of a deformed aluminum single crystal",

keywords = "Industrielle materialer",

author = "X. Huang and {Juul Jensen}, D.",

year = "2001",

language = "English",

isbn = "0-306-46487-X",

editor = "A.J. Schwartz and M. Kumar and B.L. Adams",

booktitle = "Electron backscatter diffraction in materials science",

publisher = "Kluwer Academic",

}