EBSD contra TEM characterization of a deformed aluminum single crystal

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    Original languageEnglish
    Title of host publicationElectron backscatter diffraction in materials science
    EditorsA.J. Schwartz, M. Kumar, B.L. Adams
    Place of PublicationNew York
    PublisherKluwer Academic
    Publication date2001
    ISBN (Print)0-306-46487-X
    Publication statusPublished - 2001

    Cite this

    Huang, X., & Juul Jensen, D. (2001). EBSD contra TEM characterization of a deformed aluminum single crystal. In A. J. Schwartz, M. Kumar, & B. L. Adams (Eds.), Electron backscatter diffraction in materials science Kluwer Academic.