Durability of Solid Oxide Electrolysis Cell and Interconnects for Steam Electrolysis

Xiufu Sun; Ming Chen; Yi-Lin Liu; Peter Vang Hendriksen; Mogens Bjerg Mogensen

doi:10.1149/05701.3229ecst

Durability of Solid Oxide Electrolysis Cell and Interconnects for Steam Electrolysis

Xiufu Sun, Ming Chen, Yi-Lin Liu, Peter Vang Hendriksen, Mogens Bjerg Mogensen

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

Durability of a solid oxide electrolysis cell tested at -1.5A / cm2 for high temperature steam electrolysis was investigated in the present work under stack relevant conditions. Detailed electrochemical and microstructural analyses were carried out. The results show that both the hydrogen and the oxygen electrodes degraded during the durability test. The degree of percolation loss in the active Ni-YSZ hydrogen electrode is found to decrease along the steam flow direction whereas the formation of cracks or cavities/pores within the electrolyte shows the opposite trend. The influence of sealing and interconnects on cell degradation under harsh electrolysis conditions is further discussed.

Original language	English
Journal	E C S Transactions
Volume	57
Issue number	1
Pages (from-to)	3229-3238
ISSN	1938-5862
DOIs	https://doi.org/10.1149/05701.3229ecst
Publication status	Published - 2013
Event	13th International Symposium on Solid Oxide Fuel Cells (SOFC-XIII) - Okinawa, Japan Duration: 6 Oct 2013 → 11 Oct 2013 Conference number: 13

Conference

Conference	13th International Symposium on Solid Oxide Fuel Cells (SOFC-XIII)
Number	13
Country/Territory	Japan
City	Okinawa
Period	06/10/2013 → 11/10/2013

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title = "Durability of Solid Oxide Electrolysis Cell and Interconnects for Steam Electrolysis",

abstract = "Durability of a solid oxide electrolysis cell tested at -1.5A / cm2 for high temperature steam electrolysis was investigated in the present work under stack relevant conditions. Detailed electrochemical and microstructural analyses were carried out. The results show that both the hydrogen and the oxygen electrodes degraded during the durability test. The degree of percolation loss in the active Ni-YSZ hydrogen electrode is found to decrease along the steam flow direction whereas the formation of cracks or cavities/pores within the electrolyte shows the opposite trend. The influence of sealing and interconnects on cell degradation under harsh electrolysis conditions is further discussed.",

author = "Xiufu Sun and Ming Chen and Yi-Lin Liu and Hendriksen, {Peter Vang} and Mogensen, {Mogens Bjerg}",

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T1 - Durability of Solid Oxide Electrolysis Cell and Interconnects for Steam Electrolysis

AU - Sun, Xiufu

AU - Chen, Ming

AU - Liu, Yi-Lin

AU - Hendriksen, Peter Vang

AU - Mogensen, Mogens Bjerg

N1 - Conference code: 13

PY - 2013

Y1 - 2013

N2 - Durability of a solid oxide electrolysis cell tested at -1.5A / cm2 for high temperature steam electrolysis was investigated in the present work under stack relevant conditions. Detailed electrochemical and microstructural analyses were carried out. The results show that both the hydrogen and the oxygen electrodes degraded during the durability test. The degree of percolation loss in the active Ni-YSZ hydrogen electrode is found to decrease along the steam flow direction whereas the formation of cracks or cavities/pores within the electrolyte shows the opposite trend. The influence of sealing and interconnects on cell degradation under harsh electrolysis conditions is further discussed.

AB - Durability of a solid oxide electrolysis cell tested at -1.5A / cm2 for high temperature steam electrolysis was investigated in the present work under stack relevant conditions. Detailed electrochemical and microstructural analyses were carried out. The results show that both the hydrogen and the oxygen electrodes degraded during the durability test. The degree of percolation loss in the active Ni-YSZ hydrogen electrode is found to decrease along the steam flow direction whereas the formation of cracks or cavities/pores within the electrolyte shows the opposite trend. The influence of sealing and interconnects on cell degradation under harsh electrolysis conditions is further discussed.

U2 - 10.1149/05701.3229ecst

DO - 10.1149/05701.3229ecst

M3 - Conference article

SN - 1938-5862

VL - 57

SP - 3229

EP - 3238

JO - ECS Transactions

JF - ECS Transactions

IS - 1

T2 - 13th International Symposium on Solid Oxide Fuel Cells (SOFC-XIII)

Y2 - 6 October 2013 through 11 October 2013

ER -

Durability of Solid Oxide Electrolysis Cell and Interconnects for Steam Electrolysis

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