Dislocation microstructures studied in the scanning electron microscope: Application of backscattered electrons (poster)

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Final programme and proceedings
Place of Publication	Stockholm
Publisher	Scandinavian Society for Electron Microscopy
Publication date	2001
Pages	154-155
Publication status	Published - 2001
Event	52nd Annual Meeting of the Scandinavian Society for Electron Microscopy - Stockholm, Sweden Duration: 12 Jun 2001 → 15 Jun 2001 Conference number: 52

Conference	52nd Annual Meeting of the Scandinavian Society for Electron Microscopy
Number	52
Country/Territory	Sweden
City	Stockholm
Period	12/06/2001 → 15/06/2001

OpenUrl availability

@inproceedings{adc18867754146169a616df9e6eff2f7,

title = "Dislocation microstructures studied in the scanning electron microscope: Application of backscattered electrons (poster)",

keywords = "Industrielle materialer",

author = "J.V. Carstensen and C. Buque",

year = "2001",

language = "English",

pages = "154--155",

booktitle = "Final programme and proceedings",

publisher = "Scandinavian Society for Electron Microscopy",

note = "52nd Annual Meeting of the Scandinavian Society for Electron Microscopy, SCANDEM 2001 ; Conference date: 12-06-2001 Through 15-06-2001",

}

TY - GEN

T1 - Dislocation microstructures studied in the scanning electron microscope: Application of backscattered electrons (poster)

AU - Carstensen, J.V.

AU - Buque, C.

N1 - Conference code: 52

PY - 2001

Y1 - 2001

KW - Industrielle materialer

M3 - Article in proceedings

SP - 154

EP - 155

BT - Final programme and proceedings

PB - Scandinavian Society for Electron Microscopy

CY - Stockholm

T2 - 52nd Annual Meeting of the Scandinavian Society for Electron Microscopy

Y2 - 12 June 2001 through 15 June 2001

ER -