Dislocation microstructures studied in the scanning electron microscope: Application of backscattered electrons (poster)

J.V. Carstensen, C. Buque

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

    Original languageEnglish
    Title of host publicationFinal programme and proceedings
    Place of PublicationStockholm
    PublisherScandinavian Society for Electron Microscopy
    Publication date2001
    Pages154-155
    Publication statusPublished - 2001
    Event52nd Annual Meeting of the Scandinavian Society for Electron Microscopy - Stockholm, Sweden
    Duration: 12 Jun 200115 Jun 2001
    Conference number: 52

    Conference

    Conference52nd Annual Meeting of the Scandinavian Society for Electron Microscopy
    Number52
    CountrySweden
    CityStockholm
    Period12/06/200115/06/2001

    Cite this

    Carstensen, J. V., & Buque, C. (2001). Dislocation microstructures studied in the scanning electron microscope: Application of backscattered electrons (poster). In Final programme and proceedings (pp. 154-155). Scandinavian Society for Electron Microscopy.