Discrete Tomography and Imaging of Polycrystalline Structures

Andreas Alpers

    Research output: Contribution to conferencePaperResearch

    Abstract

    High resolution transmission electron microscopy is commonly considered as the standard application for discrete tomography. While this has yet to be technically realized, new applications with a similar flavor have emerged in materials science. In our group at Ris� DTU (Denmark's National Laboratory for Sustainable Energy), for instance, we study polycrystalline materials via synchrotron X-ray diffraction. Several reconstruction problems arise, most of them exhibit inherently discrete aspects. In this talk I want to give a concise mathematical introduction to some of these reconstruction problems. Special focus is on their relationship to classical discrete tomography. Several open mathematical questions will be mentioned along the way.
    Original languageEnglish
    Publication date2009
    Publication statusPublished - 2009
    EventMeeting on Tomography and Applications to Image Reconstruction - Milano, Italy
    Duration: 26 Mar 200927 Mar 2009

    Conference

    ConferenceMeeting on Tomography and Applications to Image Reconstruction
    CountryItaly
    CityMilano
    Period26/03/200927/03/2009

    Keywords

    • Materials characterization and modelling
    • Materials research

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