Directly bonded silicon: An investigation of the interface atomic structure by x-ray diffraction

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	1997
Publication status	Published - 1997
Event	5th International Conference on Surface X-ray and Neutron Scattering - Oxford, United Kingdom Duration: 13 Jul 1997 → 17 Jul 1997 Conference number: 5 http://www.sxns12.com/history.php

Conference	5th International Conference on Surface X-ray and Neutron Scattering
Number	5
Country/Territory	United Kingdom
City	Oxford
Period	13/07/1997 → 17/07/1997
Internet address	http://www.sxns12.com/history.php

OpenUrl availability

@conference{9980ba5049d9468c8a8846ee40b7a170,

title = "Directly bonded silicon: An investigation of the interface atomic structure by x-ray diffraction",

keywords = "Nye funktionelle materialer",

author = "P.B. Howes and M. Benamara and F. Grey and R. Feidenhans'l and M. Nielsen and F.B. Rasmussen and F. Baker",

year = "1997",

language = "English",

note = "5th International Conference on Surface X-ray and Neutron Scattering, SXNS5 ; Conference date: 13-07-1997 Through 17-07-1997",

url = "http://www.sxns12.com/history.php",

}

TY - ABST

T1 - Directly bonded silicon: An investigation of the interface atomic structure by x-ray diffraction

AU - Howes, P.B.

AU - Benamara, M.

AU - Grey, F.

AU - Feidenhans'l, R.

AU - Nielsen, M.

AU - Rasmussen, F.B.

AU - Baker, F.

N1 - Conference code: 5

PY - 1997

Y1 - 1997

KW - Nye funktionelle materialer

M3 - Conference abstract for conference

T2 - 5th International Conference on Surface X-ray and Neutron Scattering

Y2 - 13 July 1997 through 17 July 1997

ER -