Directly bonded silicon: An investigation of the interface atomic structure by x-ray diffraction

P.B. Howes, M. Benamara, F. Grey, R. Feidenhans'l, M. Nielsen, F.B. Rasmussen, F. Baker

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date1997
    Publication statusPublished - 1997
    Event5th International Conference on Surface X-ray and Neutron Scattering - Oxford, United Kingdom
    Duration: 13 Jul 199717 Jul 1997
    Conference number: 5
    http://www.sxns12.com/history.php

    Conference

    Conference5th International Conference on Surface X-ray and Neutron Scattering
    Number5
    CountryUnited Kingdom
    CityOxford
    Period13/07/199717/07/1997
    Internet address

    Cite this

    Howes, P. B., Benamara, M., Grey, F., Feidenhans'l, R., Nielsen, M., Rasmussen, F. B., & Baker, F. (1997). Directly bonded silicon: An investigation of the interface atomic structure by x-ray diffraction. Abstract from 5th International Conference on Surface X-ray and Neutron Scattering, Oxford, United Kingdom.