Grain growth in an Al-0.1% Mn sample has been measured non-destructively using a three-dimensional X-ray diffraction (3DXRD) microscope. The 3-D grain morphology as well as the crystallographic orientation was determined for 483 grains in the illuminated volume prior to annealing. After annealing, a second map revealed that significant grain growth had taken place, with only 27 remaining grains in the same volume. The correlation between grain orientation, growth of grains and neighbouring relationships is explored. (c) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
|Publication status||Published - 2008|