Abstract
Nanowires and nanotubes can be examined in the transmission electron microscope under an applied bias. Here we introduce a model-independent method, which allows the charge distribution along a nanowire or nanotube to be measured directly from the Laplacian of an electron holographic phase image. We present results from a biased bundle of carbon nanotubes, in which we show that the charge density increases linearly with distance from its base, reaching a value of ~0.8 electrons/nm near its tip.
Original language | English |
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Article number | 243101 |
Journal | Applied Physics Letters |
Volume | 98 |
Issue number | 24 |
ISSN | 0003-6951 |
DOIs | |
Publication status | Published - 2011 |