Direct measurement of the charge distribution along a biased carbon nanotube bundle using electron holography

Marco Beleggia, Takeshi Kasama, Rafal E. Dunin-Borkowski, S. Hofmann, G. Pozzi

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    Abstract

    Nanowires and nanotubes can be examined in the transmission electron microscope under an applied bias. Here we introduce a model-independent method, which allows the charge distribution along a nanowire or nanotube to be measured directly from the Laplacian of an electron holographic phase image. We present results from a biased bundle of carbon nanotubes, in which we show that the charge density increases linearly with distance from its base, reaching a value of ~0.8 electrons/nm near its tip.
    Original languageEnglish
    Article number243101
    JournalApplied Physics Letters
    Volume98
    Issue number24
    ISSN0003-6951
    DOIs
    Publication statusPublished - 2011

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