Direct measurement of surface-state conductance by microscopic four-point probe method

S. Hasegawa, I. Shiraki, T. Tanikawa, Christian Leth Petersen, Torben Mikael Hansen, Peter Bøggild, Francois Grey

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    Abstract

    For in situ measurements of local electrical conductivity of well defined crystal surfaces in ultrahigh vacuum, we have developed microscopic four-point probes with a probe spacing of several micrometres, installed in a scanning-electron - microscope/electron-diffraction chamber. The probe is precisely positioned on targeted areas of the sample surface by using piezoactuators. This apparatus enables conductivity measurement with extremely high surface sensitivity, resulting in direct access to surface-state conductivity of the surface superstructures, and clarifying the influence of atomic steps upon conductivity.
    Original languageEnglish
    JournalJOURNAL OF PHYSICS-CONDENSED MATTER
    Volume14
    Issue number35
    Pages (from-to)8379-8392
    ISSN0953-8984
    Publication statusPublished - 2002

    Cite this

    Hasegawa, S., Shiraki, I., Tanikawa, T., Petersen, C. L., Hansen, T. M., Bøggild, P., & Grey, F. (2002). Direct measurement of surface-state conductance by microscopic four-point probe method. JOURNAL OF PHYSICS-CONDENSED MATTER, 14(35), 8379-8392.