Direct imaging of isofrequency contours of guided modes in extremely anisotropic all-dielectric metasurface

Dmitry Pidgayko*, Ivan S. Sinev, Dmitry V. Permyakov, Stanyslav Sychev, Frank Heyroth, Viktoriia Rutckaia, Joerg Schilling, Andrei V. Lavrinenko, Andrey A. Bogdanov, Anton Samusev

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

In this work, we investigate an all-dielectric metasurface based on the silicon on insulator platform for manipulating of guided modes in the visible and near-infrared spectral ranges. We use the Fourier modal method to demonstrate numerically, that guided modes excited in the metasurface support both hyperbolic-like and elliptic dispersion regimes. We implement a back focal plane microscope combined with a high refractive index solid immersion lens to directly image the isofrequency contours of the guided modes (surface waves). Reconstruction of dispersion unambiguously reveals the transition between different dispersion regimes.
Original languageEnglish
JournalACS Photonics
Volume6
Issue number2
Pages (from-to)510–515
ISSN2330-4022
DOIs
Publication statusPublished - 2019

Keywords

  • All-dielectric metasurface
  • Surface waves
  • Fourier modal method
  • Isofrequency contours,
  • Fourier microscopy
  • Dispersion reconstruction

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