Direct imaging of isofrequency contours of guided modes in extremely anisotropic all-dielectric metasurface

Dmitry Pidgayko*, Ivan S. Sinev, Dmitry V. Permyakov, Stanyslav Sychev, Frank Heyroth, Viktoriia Rutckaia, Joerg Schilling, Andrei V. Lavrinenko, Andrey A. Bogdanov, Anton Samusev

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

5 Downloads (Pure)

Abstract

In this work, we investigate an all-dielectric metasurface based on the silicon on insulator platform for manipulating of guided modes in the visible and near-infrared spectral ranges. We use the Fourier modal method to demonstrate numerically, that guided modes excited in the metasurface support both hyperbolic-like and elliptic dispersion regimes. We implement a back focal plane microscope combined with a high refractive index solid immersion lens to directly image the isofrequency contours of the guided modes (surface waves). Reconstruction of dispersion unambiguously reveals the transition between different dispersion regimes.
Original languageEnglish
JournalACS Photonics
Volume6
Issue number2
Pages (from-to)510–515
ISSN2330-4022
DOIs
Publication statusPublished - 2019

Keywords

  • All-dielectric metasurface
  • Surface waves
  • Fourier modal method
  • Isofrequency contours,
  • Fourier microscopy
  • Dispersion reconstruction

Cite this

Pidgayko, D., Sinev, I. S., Permyakov, D. V., Sychev, S., Heyroth, F., Rutckaia, V., ... Samusev, A. (2019). Direct imaging of isofrequency contours of guided modes in extremely anisotropic all-dielectric metasurface. ACS Photonics, 6(2), 510–515. https://doi.org/10.1021/acsphotonics.8b01487
Pidgayko, Dmitry ; Sinev, Ivan S. ; Permyakov, Dmitry V. ; Sychev, Stanyslav ; Heyroth, Frank ; Rutckaia, Viktoriia ; Schilling, Joerg ; Lavrinenko, Andrei V. ; Bogdanov, Andrey A. ; Samusev, Anton. / Direct imaging of isofrequency contours of guided modes in extremely anisotropic all-dielectric metasurface. In: ACS Photonics. 2019 ; Vol. 6, No. 2. pp. 510–515.
@article{63347be51f204f89b3d31d441f35a9a7,
title = "Direct imaging of isofrequency contours of guided modes in extremely anisotropic all-dielectric metasurface",
abstract = "In this work, we investigate an all-dielectric metasurface based on the silicon on insulator platform for manipulating of guided modes in the visible and near-infrared spectral ranges. We use the Fourier modal method to demonstrate numerically, that guided modes excited in the metasurface support both hyperbolic-like and elliptic dispersion regimes. We implement a back focal plane microscope combined with a high refractive index solid immersion lens to directly image the isofrequency contours of the guided modes (surface waves). Reconstruction of dispersion unambiguously reveals the transition between different dispersion regimes.",
keywords = "All-dielectric metasurface, Surface waves, Fourier modal method, Isofrequency contours,, Fourier microscopy, Dispersion reconstruction",
author = "Dmitry Pidgayko and Sinev, {Ivan S.} and Permyakov, {Dmitry V.} and Stanyslav Sychev and Frank Heyroth and Viktoriia Rutckaia and Joerg Schilling and Lavrinenko, {Andrei V.} and Bogdanov, {Andrey A.} and Anton Samusev",
year = "2019",
doi = "10.1021/acsphotonics.8b01487",
language = "English",
volume = "6",
pages = "510–515",
journal = "A C S Photonics",
issn = "2330-4022",
publisher = "American Chemical Society",
number = "2",

}

Pidgayko, D, Sinev, IS, Permyakov, DV, Sychev, S, Heyroth, F, Rutckaia, V, Schilling, J, Lavrinenko, AV, Bogdanov, AA & Samusev, A 2019, 'Direct imaging of isofrequency contours of guided modes in extremely anisotropic all-dielectric metasurface', ACS Photonics, vol. 6, no. 2, pp. 510–515. https://doi.org/10.1021/acsphotonics.8b01487

Direct imaging of isofrequency contours of guided modes in extremely anisotropic all-dielectric metasurface. / Pidgayko, Dmitry; Sinev, Ivan S.; Permyakov, Dmitry V.; Sychev, Stanyslav; Heyroth, Frank; Rutckaia, Viktoriia; Schilling, Joerg; Lavrinenko, Andrei V.; Bogdanov, Andrey A.; Samusev, Anton.

In: ACS Photonics, Vol. 6, No. 2, 2019, p. 510–515.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Direct imaging of isofrequency contours of guided modes in extremely anisotropic all-dielectric metasurface

AU - Pidgayko, Dmitry

AU - Sinev, Ivan S.

AU - Permyakov, Dmitry V.

AU - Sychev, Stanyslav

AU - Heyroth, Frank

AU - Rutckaia, Viktoriia

AU - Schilling, Joerg

AU - Lavrinenko, Andrei V.

AU - Bogdanov, Andrey A.

AU - Samusev, Anton

PY - 2019

Y1 - 2019

N2 - In this work, we investigate an all-dielectric metasurface based on the silicon on insulator platform for manipulating of guided modes in the visible and near-infrared spectral ranges. We use the Fourier modal method to demonstrate numerically, that guided modes excited in the metasurface support both hyperbolic-like and elliptic dispersion regimes. We implement a back focal plane microscope combined with a high refractive index solid immersion lens to directly image the isofrequency contours of the guided modes (surface waves). Reconstruction of dispersion unambiguously reveals the transition between different dispersion regimes.

AB - In this work, we investigate an all-dielectric metasurface based on the silicon on insulator platform for manipulating of guided modes in the visible and near-infrared spectral ranges. We use the Fourier modal method to demonstrate numerically, that guided modes excited in the metasurface support both hyperbolic-like and elliptic dispersion regimes. We implement a back focal plane microscope combined with a high refractive index solid immersion lens to directly image the isofrequency contours of the guided modes (surface waves). Reconstruction of dispersion unambiguously reveals the transition between different dispersion regimes.

KW - All-dielectric metasurface

KW - Surface waves

KW - Fourier modal method

KW - Isofrequency contours,

KW - Fourier microscopy

KW - Dispersion reconstruction

U2 - 10.1021/acsphotonics.8b01487

DO - 10.1021/acsphotonics.8b01487

M3 - Journal article

VL - 6

SP - 510

EP - 515

JO - A C S Photonics

JF - A C S Photonics

SN - 2330-4022

IS - 2

ER -