We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.
|Journal||I E E E Photonics Technology Letters|
|Publication status||Published - Jun 1998|
- scanning near-field optical microscopy (SNOM)
- ultraviolet-induced index changes (photosensitivity)