Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy

Mikael Svalgaard, S. Madsen, Jørn Märcher Hvam, Martin Kristensen

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    Abstract

    We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.
    Original languageEnglish
    JournalI E E E Photonics Technology Letters
    Volume10
    Issue number6
    Pages (from-to)848-850
    ISSN1041-1135
    DOIs
    Publication statusPublished - Jun 1998

    Keywords

    • scanning near-field optical microscopy (SNOM)
    • silica-on-silicon
    • ultraviolet-induced index changes (photosensitivity)

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