Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy

Mikael Svalgaard; S. Madsen; Jørn Märcher Hvam; Martin Kristensen

doi:10.1109/68.681506

Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy

Mikael Svalgaard, S. Madsen, Jørn Märcher Hvam, Martin Kristensen

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.

Original language	English
Journal	I E E E Photonics Technology Letters
Volume	10
Issue number	6
Pages (from-to)	848-850
ISSN	1041-1135
DOIs	https://doi.org/10.1109/68.681506
Publication status	Published - Jun 1998

Keywords

scanning near-field optical microscopy (SNOM)
silica-on-silicon
ultraviolet-induced index changes (photosensitivity)

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title = "Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy",

abstract = "We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written waveguides. ",

keywords = "scanning near-field optical microscopy (SNOM), silica-on-silicon, ultraviolet-induced index changes (photosensitivity) ",

author = "Mikael Svalgaard and S. Madsen and Hvam, {J{\o}rn M{\"a}rcher} and Martin Kristensen",

year = "1998",

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AU - Madsen, S.

AU - Hvam, Jørn Märcher

AU - Kristensen, Martin

PY - 1998/6

Y1 - 1998/6

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AB - We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.

KW - scanning near-field optical microscopy (SNOM)

KW - silica-on-silicon

KW - ultraviolet-induced index changes (photosensitivity)

U2 - 10.1109/68.681506

DO - 10.1109/68.681506

M3 - Journal article

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EP - 850

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

IS - 6

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Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy

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Keywords

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