We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.
- scanning near-field optical microscopy (SNOM)
- ultraviolet-induced index changes (photosensitivity)
Svalgaard, M., Madsen, S., Hvam, J. M., & Kristensen, M. (1998). Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy. I E E E Photonics Technology Letters, 10(6), 848-850. https://doi.org/10.1109/68.681506