Dimensional measurements with submicrometer uncertainty in production environment

L. De Chiffre, M. M. Gudnason, D. Madruga

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

The work concerns a laboratory investigation of a method to achieve dimensional measurements with submicrometer uncertainty under conditions that are typical of a production environment. The method involves the concurrent determination of dimensions and material properties from measurements carried out over time. A laboratory set-up was developed comprising a pair of electronic probes mounted on a Zerodur block featuring near zero thermal expansion. Three temperature sensors, data acquisition system, and a temperature regulated plate for heating the workpiece were implemented. Investigations with synchronous measurements of length and temperature during cooling from 25 °C to 20 °C were carried out, using two calibrated gauge blocks as workpieces, i.e., a steel gauge block and a tungsten carbide gauge block. Each measurement was repeated 9 times. Coefficients of thermal expansion (CTE) for the two gauge blocks along with their uncertainties were estimated directly from the measurements. The length of the two workpieces at the reference temperature of 20 °C was extrapolated from the measurements and compared to certificate values. The investigations have documented that the developed approach and laboratory equipment allow traceable length measurements with expanded uncertainties (k=2) below 1 μm.
Original languageEnglish
Title of host publicationProceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology
Publication date2015
Pages163-4
ISBN (Print)9780956679079
Publication statusPublished - 2015
Event15th euspen International Conference & Exhibition (2015) - Leuven, Belgium
Duration: 1 Jun 20155 Jun 2015
Conference number: 15
http://www.euspen.eu/OurEvents/Leuven2015.aspx

Conference

Conference15th euspen International Conference & Exhibition (2015)
Number15
CountryBelgium
CityLeuven
Period01/06/201505/06/2015
Internet address

Cite this

De Chiffre, L., Gudnason, M. M., & Madruga, D. (2015). Dimensional measurements with submicrometer uncertainty in production environment. In Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology (pp. 163-4)