TY - JOUR
T1 - Dimensional artefacts to achieve metrological traceability in advanced manufacturing
AU - Carmignato, S.
AU - De Chiffre, L.
AU - Bosse, H.
AU - Leach, R. K.
AU - Balsamo, A.
AU - Estler, W. T.
PY - 2020
Y1 - 2020
N2 - Dimensional measurements play a central role in enabling advanced manufacturing technologies, enhancing the quality of products and increasing productivity. This role becomes even more important in the context of Industry 4.0, where reliable and accurate digital models of products, processes and production systems are needed. To establish the traceability chain that links measurements in production to the length unit, dimensional artefacts – ranging from measurement standards to calibrated workpieces – are fundamental. The paper examines dimensional artefacts, discussing their characteristics, availability and role in supporting production by establishing metrological traceability, and provides guidelines for their selection, use and development.
AB - Dimensional measurements play a central role in enabling advanced manufacturing technologies, enhancing the quality of products and increasing productivity. This role becomes even more important in the context of Industry 4.0, where reliable and accurate digital models of products, processes and production systems are needed. To establish the traceability chain that links measurements in production to the length unit, dimensional artefacts – ranging from measurement standards to calibrated workpieces – are fundamental. The paper examines dimensional artefacts, discussing their characteristics, availability and role in supporting production by establishing metrological traceability, and provides guidelines for their selection, use and development.
KW - Dimensional artefacts
KW - Manufacturing metrology
KW - Traceability
U2 - 10.1016/j.cirp.2020.05.009
DO - 10.1016/j.cirp.2020.05.009
M3 - Journal article
AN - SCOPUS:85086447831
SN - 0007-8506
VL - 69
SP - 693
EP - 716
JO - CIRP Annals
JF - CIRP Annals
IS - 2
ER -