Diffraction studies of bonded silicon interfaces

M. Benamara; P.B. Howes; M. Nielsen; F.B. Rasmussen; R. Feidenhans'l; K. Hermansson; F. Grey

Diffraction studies of bonded silicon interfaces

M. Benamara
, P.B. Howes
, M. Nielsen
, F.B. Rasmussen
, R. Feidenhans'l
, K. Hermansson
, F. Grey

Research output: Contribution to journal › Conference article › Research

Original language	English
Journal	Electrochem. Soc. Proc.
Volume	97-36
Pages (from-to)	280-284
Publication status	Published - 1998
Event	192th Meeting of The Electrochemical Society, Inc. / 48th Annual meeting of the International Society of Electrochemistry - Paris, France Duration: 31 Aug 1997 → 5 Sept 1997 Conference number: 192 / 48

Conference

Conference	192th Meeting of The Electrochemical Society, Inc. / 48th Annual meeting of the International Society of Electrochemistry
Number	192 / 48
Country/Territory	France
City	Paris
Period	31/08/1997 → 05/09/1997
Other	1997 Joint International Meeting

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Cite this

@inproceedings{83c78eec8d9c407194a716d37b017a8f,

title = "Diffraction studies of bonded silicon interfaces",

keywords = "Nye funktionelle materialer",

author = "M. Benamara and P.B. Howes and M. Nielsen and F.B. Rasmussen and R. Feidenhans'l and K. Hermansson and F. Grey",

year = "1998",

language = "English",

volume = "97-36",

pages = "280--284",

journal = "Electrochem. Soc. Proc.",

note = "192th Meeting of The Electrochemical Society, Inc. / 48th Annual meeting of the International Society of Electrochemistry ; Conference date: 31-08-1997 Through 05-09-1997",

}

TY - GEN

T1 - Diffraction studies of bonded silicon interfaces

AU - Benamara, M.

AU - Howes, P.B.

AU - Nielsen, M.

AU - Rasmussen, F.B.

AU - Feidenhans'l, R.

AU - Hermansson, K.

AU - Grey, F.

N1 - Conference code: 192 / 48

PY - 1998

Y1 - 1998

KW - Nye funktionelle materialer

M3 - Conference article

VL - 97-36

SP - 280

EP - 284

JO - Electrochem. Soc. Proc.

JF - Electrochem. Soc. Proc.

T2 - 192th Meeting of The Electrochemical Society, Inc. / 48th Annual meeting of the International Society of Electrochemistry

Y2 - 31 August 1997 through 5 September 1997

ER -