Diffraction studies of bonded silicon interfaces

M. Benamara, P.B. Howes, M. Nielsen, F.B. Rasmussen, R. Feidenhans'l, K. Hermansson, F. Grey

    Research output: Contribution to journalConference articleResearch

    Original languageEnglish
    JournalElectrochem. Soc. Proc.
    Volume97-36
    Pages (from-to)280-284
    Publication statusPublished - 1998
    Event1997 Joint international meeting - The 192. Meeting of The Electrochemical Society, Inc. and the 48. Annual meeting of the International Society of Electrochemistry - Paris (FR), 31 Aug - 5 Sep
    Duration: 1 Jan 1997 → …

    Conference

    Conference1997 Joint international meeting - The 192. Meeting of The Electrochemical Society, Inc. and the 48. Annual meeting of the International Society of Electrochemistry
    CityParis (FR), 31 Aug - 5 Sep
    Period01/01/1997 → …

    Cite this

    Benamara, M., Howes, P. B., Nielsen, M., Rasmussen, F. B., Feidenhans'l, R., Hermansson, K., & Grey, F. (1998). Diffraction studies of bonded silicon interfaces. Electrochem. Soc. Proc., 97-36, 280-284.
    Benamara, M. ; Howes, P.B. ; Nielsen, M. ; Rasmussen, F.B. ; Feidenhans'l, R. ; Hermansson, K. ; Grey, F. / Diffraction studies of bonded silicon interfaces. In: Electrochem. Soc. Proc. 1998 ; Vol. 97-36. pp. 280-284.
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    title = "Diffraction studies of bonded silicon interfaces",
    keywords = "Nye funktionelle materialer",
    author = "M. Benamara and P.B. Howes and M. Nielsen and F.B. Rasmussen and R. Feidenhans'l and K. Hermansson and F. Grey",
    year = "1998",
    language = "English",
    volume = "97-36",
    pages = "280--284",
    journal = "Electrochem. Soc. Proc.",

    }

    Benamara, M, Howes, PB, Nielsen, M, Rasmussen, FB, Feidenhans'l, R, Hermansson, K & Grey, F 1998, 'Diffraction studies of bonded silicon interfaces', Electrochem. Soc. Proc., vol. 97-36, pp. 280-284.

    Diffraction studies of bonded silicon interfaces. / Benamara, M.; Howes, P.B.; Nielsen, M.; Rasmussen, F.B.; Feidenhans'l, R.; Hermansson, K.; Grey, F.

    In: Electrochem. Soc. Proc., Vol. 97-36, 1998, p. 280-284.

    Research output: Contribution to journalConference articleResearch

    TY - GEN

    T1 - Diffraction studies of bonded silicon interfaces

    AU - Benamara, M.

    AU - Howes, P.B.

    AU - Nielsen, M.

    AU - Rasmussen, F.B.

    AU - Feidenhans'l, R.

    AU - Hermansson, K.

    AU - Grey, F.

    PY - 1998

    Y1 - 1998

    KW - Nye funktionelle materialer

    M3 - Conference article

    VL - 97-36

    SP - 280

    EP - 284

    JO - Electrochem. Soc. Proc.

    JF - Electrochem. Soc. Proc.

    ER -

    Benamara M, Howes PB, Nielsen M, Rasmussen FB, Feidenhans'l R, Hermansson K et al. Diffraction studies of bonded silicon interfaces. Electrochem. Soc. Proc. 1998;97-36:280-284.