Developing and applying high-throughput exposure models for screening-level chemical assessment: The ExpoDat project

Jon Arnot, Alexi Ernstoff, Hyeong-Moo Shin, Susan Csizar, Peter Fantke, Xianming Zhang, Olivier Jolliet, Deborah Bennett, Barbara Wetmore

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    Original languageEnglish
    Publication date2014
    Publication statusPublished - 2014
    EventICCA-LRI and JRC Workshop 2014 - Lugano, Switzerland
    Duration: 17 Jun 201418 Jun 2014

    Conference

    ConferenceICCA-LRI and JRC Workshop 2014
    CountrySwitzerland
    CityLugano
    Period17/06/201418/06/2014

    Bibliographical note

    Oral presentation

    Cite this

    Arnot, J., Ernstoff, A., Shin, H-M., Csizar, S., Fantke, P., Zhang, X., Jolliet, O., Bennett, D., & Wetmore, B. (2014). Developing and applying high-throughput exposure models for screening-level chemical assessment: The ExpoDat project. Abstract from ICCA-LRI and JRC Workshop 2014, Lugano, Switzerland.