Developing an atomic scale model for grain boundary potentials in perovskite oxides using Z-contrast imaging and EELS

Robert F. Klie, Marco Beleggia, Yimei Zhu, James P. Buban, Nigel D. Browning

Research output: Contribution to journal › Conference article › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	10
Issue number	Supplement S02
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S1431927604880395
Publication status	Published - 2004
Externally published	Yes
Event	Microscopy and Microanalysis 2004 - Savannah, GA, United States Duration: 1 Aug 2004 → 5 Aug 2004

Conference	Microscopy and Microanalysis 2004
Country/Territory	United States
City	Savannah, GA
Period	01/08/2004 → 05/08/2004

Access to Document

@inproceedings{32695219617f42c7babe2fd7d7074d53,

title = "Developing an atomic scale model for grain boundary potentials in perovskite oxides using Z-contrast imaging and EELS",

author = "Klie, {Robert F.} and Marco Beleggia and Yimei Zhu and Buban, {James P.} and Browning, {Nigel D.}",

year = "2004",

doi = "10.1017/S1431927604880395",

language = "English",

volume = "10",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Supplement S02",

note = "Microscopy and Microanalysis 2004 ; Conference date: 01-08-2004 Through 05-08-2004",

}

TY - GEN

T1 - Developing an atomic scale model for grain boundary potentials in perovskite oxides using Z-contrast imaging and EELS

AU - Klie, Robert F.

AU - Beleggia, Marco

AU - Zhu, Yimei

AU - Buban, James P.

AU - Browning, Nigel D.

PY - 2004

Y1 - 2004

U2 - 10.1017/S1431927604880395

DO - 10.1017/S1431927604880395

M3 - Conference article

SN - 1431-9276

VL - 10

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Supplement S02

T2 - Microscopy and Microanalysis 2004

Y2 - 1 August 2004 through 5 August 2004

ER -